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A Mode-Matched Silicon-Yaw Tuning-Fork Gyroscope With Subdegree-Per-Hour Allan Deviation Bias Instability
In this paper, we report on the design, fabrication, and characterization of an in-plane mode-matched tuning-fork gyroscope (M 2 -TFG). The M 2 -TFG uses two high-quality-factor (Q) resonant flexural modes of a single crystalline silicon mi- crostructure to detect angular rate about the normal axis....
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Published in: | Journal of microelectromechanical systems 2008-12, Vol.17 (6), p.1526-1536 |
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description | In this paper, we report on the design, fabrication, and characterization of an in-plane mode-matched tuning-fork gyroscope (M 2 -TFG). The M 2 -TFG uses two high-quality-factor (Q) resonant flexural modes of a single crystalline silicon mi- crostructure to detect angular rate about the normal axis. Operating the device under mode-matched condition, i.e., zero-hertz frequency split between drive and sense modes, enables a Q -factor mechanical amplification in the rate sensitivity and also improves the overall noise floor and bias stability of the device. The M 2 -TFG is fabricated on a silicon-on-insulator substrate using a combination of device and handle-layer silicon etching that precludes the need for any release openings on the proof-mass, thereby maximizing the mass per unit area. Experimental data indicate subdegree-per-hour Brownian noise floor with a measured Allan deviation bias instability of 0.15deg /hr for a 60-mum-thick 1.5 mm X 1.7 mm footprint M 2 -TFG prototype. The gyroscope exhibits an open-loop rate sensitivity of approximately 83 mV/deg/s in vacuum. [2007-0100]. |
doi_str_mv | 10.1109/JMEMS.2008.2004794 |
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The M 2 -TFG uses two high-quality-factor (Q) resonant flexural modes of a single crystalline silicon mi- crostructure to detect angular rate about the normal axis. Operating the device under mode-matched condition, i.e., zero-hertz frequency split between drive and sense modes, enables a Q -factor mechanical amplification in the rate sensitivity and also improves the overall noise floor and bias stability of the device. The M 2 -TFG is fabricated on a silicon-on-insulator substrate using a combination of device and handle-layer silicon etching that precludes the need for any release openings on the proof-mass, thereby maximizing the mass per unit area. Experimental data indicate subdegree-per-hour Brownian noise floor with a measured Allan deviation bias instability of 0.15deg /hr for a 60-mum-thick 1.5 mm X 1.7 mm footprint M 2 -TFG prototype. The gyroscope exhibits an open-loop rate sensitivity of approximately 83 mV/deg/s in vacuum. [2007-0100].</description><identifier>ISSN: 1057-7157</identifier><identifier>EISSN: 1941-0158</identifier><identifier>DOI: 10.1109/JMEMS.2008.2004794</identifier><identifier>CODEN: JMIYET</identifier><language>eng</language><publisher>New York, NY: IEEE</publisher><subject>Bias ; Crystallization ; Deviation ; Devices ; Etching ; Exact sciences and technology ; Fabrication ; Frequency ; Gyroscopes ; Instability ; Instruments, apparatus, components and techniques common to several branches of physics and astronomy ; Measurements common to several branches of physics and astronomy ; Mechanical instruments, equipment and techniques ; Metrology, measurements and laboratory procedures ; Micromechanical devices and systems ; Mode-matching ; Noise ; Noise measurement ; Physics ; Prototypes ; Resonance ; Silicon on insulator technology ; Silicon substrates ; silicon-on-insulator (SOI) ; Stability ; tuning fork ; Velocity, acceleration and rotation ; vibratory microgyroscope</subject><ispartof>Journal of microelectromechanical systems, 2008-12, Vol.17 (6), p.1526-1536</ispartof><rights>2009 INIST-CNRS</rights><rights>Copyright The Institute of Electrical and Electronics Engineers, Inc. (IEEE) 2008</rights><lds50>peer_reviewed</lds50><woscitedreferencessubscribed>false</woscitedreferencessubscribed><citedby>FETCH-LOGICAL-c452t-e7d5a1a42b609e83c53d3f60304feffee178dafdd5c278dfd077e8acdbd3af343</citedby><cites>FETCH-LOGICAL-c452t-e7d5a1a42b609e83c53d3f60304feffee178dafdd5c278dfd077e8acdbd3af343</cites></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://ieeexplore.ieee.org/document/4636724$$EHTML$$P50$$Gieee$$H</linktohtml><link.rule.ids>314,780,784,27924,27925,54796</link.rule.ids><backlink>$$Uhttp://pascal-francis.inist.fr/vibad/index.php?action=getRecordDetail&idt=21107496$$DView record in Pascal Francis$$Hfree_for_read</backlink></links><search><creatorcontrib>Zaman, M.F.</creatorcontrib><creatorcontrib>Sharma, A.</creatorcontrib><creatorcontrib>Zhili Hao</creatorcontrib><creatorcontrib>Ayazi, F.</creatorcontrib><title>A Mode-Matched Silicon-Yaw Tuning-Fork Gyroscope With Subdegree-Per-Hour Allan Deviation Bias Instability</title><title>Journal of microelectromechanical systems</title><addtitle>JMEMS</addtitle><description>In this paper, we report on the design, fabrication, and characterization of an in-plane mode-matched tuning-fork gyroscope (M 2 -TFG). The M 2 -TFG uses two high-quality-factor (Q) resonant flexural modes of a single crystalline silicon mi- crostructure to detect angular rate about the normal axis. Operating the device under mode-matched condition, i.e., zero-hertz frequency split between drive and sense modes, enables a Q -factor mechanical amplification in the rate sensitivity and also improves the overall noise floor and bias stability of the device. The M 2 -TFG is fabricated on a silicon-on-insulator substrate using a combination of device and handle-layer silicon etching that precludes the need for any release openings on the proof-mass, thereby maximizing the mass per unit area. Experimental data indicate subdegree-per-hour Brownian noise floor with a measured Allan deviation bias instability of 0.15deg /hr for a 60-mum-thick 1.5 mm X 1.7 mm footprint M 2 -TFG prototype. The gyroscope exhibits an open-loop rate sensitivity of approximately 83 mV/deg/s in vacuum. [2007-0100].</description><subject>Bias</subject><subject>Crystallization</subject><subject>Deviation</subject><subject>Devices</subject><subject>Etching</subject><subject>Exact sciences and technology</subject><subject>Fabrication</subject><subject>Frequency</subject><subject>Gyroscopes</subject><subject>Instability</subject><subject>Instruments, apparatus, components and techniques common to several branches of physics and astronomy</subject><subject>Measurements common to several branches of physics and astronomy</subject><subject>Mechanical instruments, equipment and techniques</subject><subject>Metrology, measurements and laboratory procedures</subject><subject>Micromechanical devices and systems</subject><subject>Mode-matching</subject><subject>Noise</subject><subject>Noise measurement</subject><subject>Physics</subject><subject>Prototypes</subject><subject>Resonance</subject><subject>Silicon on insulator technology</subject><subject>Silicon substrates</subject><subject>silicon-on-insulator (SOI)</subject><subject>Stability</subject><subject>tuning fork</subject><subject>Velocity, acceleration and rotation</subject><subject>vibratory microgyroscope</subject><issn>1057-7157</issn><issn>1941-0158</issn><fulltext>true</fulltext><rsrctype>article</rsrctype><creationdate>2008</creationdate><recordtype>article</recordtype><recordid>eNqFkUtv1DAUhSNEJUrhD8DGQuKxcfErdryclj7VEUhThFhFHvu6dUnjwU5azb_HYUZddNFu7r2Sv3NknVNV7yjZp5Tor-fzo_linxHSTEMoLV5Uu1QLigmtm5flJrXCitbqVfU65xtCqBCN3K3CDM2jAzw3g70GhxahCzb2-Le5R5djH_orfBzTH3SyTjHbuAL0KwzXaDEuHVwlAPwDEj6NY0KzrjM9-gZ3wQwh9uggmIzO-jyYZfEc1m-qHW-6DG-3e6_6eXx0eXiKL76fnB3OLrAVNRswKFcbagRbSqKh4bbmjntJOBEevAegqnHGO1dbVi7viFLQGOuWjhvPBd-rPm98Vyn-HSEP7W3IFqbfQRxzqwmXvIRSP0s2DZFCKTl5fnqS5ELwRlNewC9PglQqyuoSPinoh0foTYmxL9G0mjKuhNSsQGwD2RJ_TuDbVQq3Jq1bStqp-fZ_8-3UfLttvog-bp1NtqbzyfQ25AclKzoltCzc-w0XAODhWUguFRP8Hxuatk8</recordid><startdate>20081201</startdate><enddate>20081201</enddate><creator>Zaman, M.F.</creator><creator>Sharma, A.</creator><creator>Zhili Hao</creator><creator>Ayazi, F.</creator><general>IEEE</general><general>Institute of Electrical and Electronics Engineers</general><general>The Institute of Electrical and Electronics Engineers, Inc. (IEEE)</general><scope>97E</scope><scope>RIA</scope><scope>RIE</scope><scope>IQODW</scope><scope>AAYXX</scope><scope>CITATION</scope><scope>7SP</scope><scope>7TB</scope><scope>7U5</scope><scope>8FD</scope><scope>FR3</scope><scope>L7M</scope><scope>F28</scope></search><sort><creationdate>20081201</creationdate><title>A Mode-Matched Silicon-Yaw Tuning-Fork Gyroscope With Subdegree-Per-Hour Allan Deviation Bias Instability</title><author>Zaman, M.F. ; Sharma, A. ; Zhili Hao ; Ayazi, F.</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-c452t-e7d5a1a42b609e83c53d3f60304feffee178dafdd5c278dfd077e8acdbd3af343</frbrgroupid><rsrctype>articles</rsrctype><prefilter>articles</prefilter><language>eng</language><creationdate>2008</creationdate><topic>Bias</topic><topic>Crystallization</topic><topic>Deviation</topic><topic>Devices</topic><topic>Etching</topic><topic>Exact sciences and technology</topic><topic>Fabrication</topic><topic>Frequency</topic><topic>Gyroscopes</topic><topic>Instability</topic><topic>Instruments, apparatus, components and techniques common to several branches of physics and astronomy</topic><topic>Measurements common to several branches of physics and astronomy</topic><topic>Mechanical instruments, equipment and techniques</topic><topic>Metrology, measurements and laboratory procedures</topic><topic>Micromechanical devices and systems</topic><topic>Mode-matching</topic><topic>Noise</topic><topic>Noise measurement</topic><topic>Physics</topic><topic>Prototypes</topic><topic>Resonance</topic><topic>Silicon on insulator technology</topic><topic>Silicon substrates</topic><topic>silicon-on-insulator (SOI)</topic><topic>Stability</topic><topic>tuning fork</topic><topic>Velocity, acceleration and rotation</topic><topic>vibratory microgyroscope</topic><toplevel>peer_reviewed</toplevel><toplevel>online_resources</toplevel><creatorcontrib>Zaman, M.F.</creatorcontrib><creatorcontrib>Sharma, A.</creatorcontrib><creatorcontrib>Zhili Hao</creatorcontrib><creatorcontrib>Ayazi, F.</creatorcontrib><collection>IEEE All-Society Periodicals Package (ASPP) 2005-present</collection><collection>IEEE All-Society Periodicals Package (ASPP) 1998-Present</collection><collection>IEEE Xplore</collection><collection>Pascal-Francis</collection><collection>CrossRef</collection><collection>Electronics & Communications Abstracts</collection><collection>Mechanical & Transportation Engineering Abstracts</collection><collection>Solid State and Superconductivity Abstracts</collection><collection>Technology Research Database</collection><collection>Engineering Research Database</collection><collection>Advanced Technologies Database with Aerospace</collection><collection>ANTE: Abstracts in New Technology & Engineering</collection><jtitle>Journal of microelectromechanical systems</jtitle></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext</fulltext></delivery><addata><au>Zaman, M.F.</au><au>Sharma, A.</au><au>Zhili Hao</au><au>Ayazi, F.</au><format>journal</format><genre>article</genre><ristype>JOUR</ristype><atitle>A Mode-Matched Silicon-Yaw Tuning-Fork Gyroscope With Subdegree-Per-Hour Allan Deviation Bias Instability</atitle><jtitle>Journal of microelectromechanical systems</jtitle><stitle>JMEMS</stitle><date>2008-12-01</date><risdate>2008</risdate><volume>17</volume><issue>6</issue><spage>1526</spage><epage>1536</epage><pages>1526-1536</pages><issn>1057-7157</issn><eissn>1941-0158</eissn><coden>JMIYET</coden><abstract>In this paper, we report on the design, fabrication, and characterization of an in-plane mode-matched tuning-fork gyroscope (M 2 -TFG). The M 2 -TFG uses two high-quality-factor (Q) resonant flexural modes of a single crystalline silicon mi- crostructure to detect angular rate about the normal axis. Operating the device under mode-matched condition, i.e., zero-hertz frequency split between drive and sense modes, enables a Q -factor mechanical amplification in the rate sensitivity and also improves the overall noise floor and bias stability of the device. The M 2 -TFG is fabricated on a silicon-on-insulator substrate using a combination of device and handle-layer silicon etching that precludes the need for any release openings on the proof-mass, thereby maximizing the mass per unit area. Experimental data indicate subdegree-per-hour Brownian noise floor with a measured Allan deviation bias instability of 0.15deg /hr for a 60-mum-thick 1.5 mm X 1.7 mm footprint M 2 -TFG prototype. The gyroscope exhibits an open-loop rate sensitivity of approximately 83 mV/deg/s in vacuum. 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subjects | Bias Crystallization Deviation Devices Etching Exact sciences and technology Fabrication Frequency Gyroscopes Instability Instruments, apparatus, components and techniques common to several branches of physics and astronomy Measurements common to several branches of physics and astronomy Mechanical instruments, equipment and techniques Metrology, measurements and laboratory procedures Micromechanical devices and systems Mode-matching Noise Noise measurement Physics Prototypes Resonance Silicon on insulator technology Silicon substrates silicon-on-insulator (SOI) Stability tuning fork Velocity, acceleration and rotation vibratory microgyroscope |
title | A Mode-Matched Silicon-Yaw Tuning-Fork Gyroscope With Subdegree-Per-Hour Allan Deviation Bias Instability |
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