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Controlling a Magnetic Force Microscope to Track a Magnetized Nanosize Particle

In this paper, we introduce a scheme for tracking a magnetic nanoparticle moving in three dimensions using a magnetic force microscope (MFM). The stray magnetic field of the magnetic particle induces a shift in the phase of oscillation of the tip of the MFM. We present a nonlinear feedback control l...

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Published in:	IEEE transactions on nanotechnology 2010-05, Vol.9 (3), p.367-374
Main Authors:	Baronov, Dimitar, Andersson, Sean B
Format:	Article
Language:	English
Subjects:	Cross-disciplinary physics: materials science rheology Exact sciences and technology Feedback control Force control Magnetic field measurement Magnetic fields Magnetic force microscopy Magnetic force microscopy (MFM) Magnetic forces Magnetic particles Materials science Nanocomposites Nanomaterials Nanoscale materials and structures: fabrication and characterization Nanostructure nanotechnology nonlinear systems Numerical simulation Oscillations Other topics in nanoscale materials and structures Particle measurements Particle tracking Phase measurement Phase shift Physics Three dimensional Tracking Trajectories
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cited_by	cdi_FETCH-LOGICAL-c390t-9f010519b80c8949ca788419462ee4d37d7ca912231aad4b8415894fdd40b2003
cites	cdi_FETCH-LOGICAL-c390t-9f010519b80c8949ca788419462ee4d37d7ca912231aad4b8415894fdd40b2003
container_end_page	374
container_issue	3
container_start_page	367
container_title	IEEE transactions on nanotechnology
container_volume	9
creator	Baronov, Dimitar Andersson, Sean B
description	In this paper, we introduce a scheme for tracking a magnetic nanoparticle moving in three dimensions using a magnetic force microscope (MFM). The stray magnetic field of the magnetic particle induces a shift in the phase of oscillation of the tip of the MFM. We present a nonlinear feedback control law that translates the measurement of this phase shift into a trajectory for the tip of the MFM and prove that this trajectory converges to a neighborhood of the magnetic particle. The viability of the proposed tracking scheme is verified through numerical simulations of the tracking algorithm.
doi_str_mv	10.1109/TNANO.2009.2029982
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source	IEEE Electronic Library (IEL) Journals
subjects	Cross-disciplinary physics: materials science rheology Exact sciences and technology Feedback control Force control Magnetic field measurement Magnetic fields Magnetic force microscopy Magnetic force microscopy (MFM) Magnetic forces Magnetic particles Materials science Nanocomposites Nanomaterials Nanoscale materials and structures: fabrication and characterization Nanostructure nanotechnology nonlinear systems Numerical simulation Oscillations Other topics in nanoscale materials and structures Particle measurements Particle tracking Phase measurement Phase shift Physics Three dimensional Tracking Trajectories
title	Controlling a Magnetic Force Microscope to Track a Magnetized Nanosize Particle
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