Metrological support of linear measurements in the range 0.001–100,000 m

The precision of the transfer of the dimension of the unit of length is reduced because the process of transferring the unit is multi-step in nature. A concept of the metrological support of linear measurements that depends on wavelength standards of length is proposed. A projected accuracy chart th...

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Bibliographic Details
Published in:Measurement techniques 1999-06, Vol.42 (6), p.555-558
Main Author: Pushkarev, G P
Format: Article
Language:English
Subjects:
Measurement techniques
Metrology
Studies
Wavelengths
Online Access:Get full text
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Summary:The precision of the transfer of the dimension of the unit of length is reduced because the process of transferring the unit is multi-step in nature. A concept of the metrological support of linear measurements that depends on wavelength standards of length is proposed. A projected accuracy chart that implements this concept is proposed.[PUBLICATION ABSTRACT]
ISSN:0543-1972
1573-8906
DOI:10.1007/BF02504412