Detection of exogenous contaminants of fingerprints using ToF-SIMS

The aim of this study is to present an application of ToF‐SIMS in forensic research, especially in the imaging of fingerprints and detection of traces of various substances, which do not exist in natural skin excretion, but can be connected with a crime scene. Exemplary ToF‐SIMS images of fingerprin...

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Bibliographic Details
Published in:Surface and interface analysis 2010-05, Vol.42 (5), p.393-397
Main Authors: Szynkowska, M. I., Czerski, K., Rogowski, J., Paryjczak, T., Parczewski, A.
Format: Article
Language:English
Subjects:
Aluminum
Contaminants
dactyloscopy
Fingerprints
forensic
Forensic engineering
Forensic science
Imaging
Nickel
ToF-SIMS
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Summary:The aim of this study is to present an application of ToF‐SIMS in forensic research, especially in the imaging of fingerprints and detection of traces of various substances, which do not exist in natural skin excretion, but can be connected with a crime scene. Exemplary ToF‐SIMS images of fingerprints from fingers contaminated with traces of different substances (arsenic, nickel, gunshot residues, amphetamine drugs, etc.) using three kinds of bases (aluminum, stainless steel and brass) are showed. The results of the study show the potential of ToF‐SIMS technique in the analysis of fingerprints with a view to use in forensic science. Copyright © 2010 John Wiley & Sons, Ltd.
ISSN:0142-2421
1096-9918
1096-9918
DOI:10.1002/sia.3193