Neutron-induced pion production in silicon-based circuits

We compare deposition spectra from monoenergetic neutron irradiation to CUPID simulations of the same neutron exposures. CUPID does not agree with the experimental data unless pion production is included in the neutron-nucleon interaction. Pion-production events result in slightly more single-event...

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Bibliographic Details
Published in:IEEE transactions on nuclear science 2003-12, Vol.50 (6), p.2251-2255
Main Authors: Kinnison, J.D., Maurer, R., Roth, D.R., McNulty, P.J., Abdel-Kader, W.G.
Format: Article
Language:English
Subjects:
Circuits
Deposition
Detectors
Devices
Laboratories
Mesons
NASA
Neutron irradiation
Neutrons
Physics
Pions
Production
Protons
Silicon
Simulation
Spectra
Thresholds
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Description
Summary:We compare deposition spectra from monoenergetic neutron irradiation to CUPID simulations of the same neutron exposures. CUPID does not agree with the experimental data unless pion production is included in the neutron-nucleon interaction. Pion-production events result in slightly more single-event effects (SEEs) for devices with relatively large sensitive volumes and low thresholds for upset but dramatically fewer events for the same sensitive volume when the threshold is high.
ISSN:0018-9499
1558-1578
DOI:10.1109/TNS.2003.821385