Forward-looking fault simulation for improved static compaction

Fault simulation of a test set in an order different from the order of generation (e.g., reverse- or random-order fault simulation) is used as a fast and effective method to drop unnecessary tests from a test set in order to reduce its size. We propose an improvement to this type of fault simulation...

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Bibliographic Details
Published in:IEEE transactions on computer-aided design of integrated circuits and systems 2001-10, Vol.20 (10), p.1262-1265, Article 1262
Main Authors: Pomeranz, I., Reddy, S.M.
Format: Article
Language:English
Subjects:
Circuit faults
Circuit simulation
Circuit testing
Compaction
Computational modeling
Computer aided design
Computer simulation
Design engineering
Drop tests
Electrical fault detection
Fault detection
Fault diagnosis
Faults
Impact tests
Integrated circuits
Names
Sequential analysis
Sequential circuits
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Summary:Fault simulation of a test set in an order different from the order of generation (e.g., reverse- or random-order fault simulation) is used as a fast and effective method to drop unnecessary tests from a test set in order to reduce its size. We propose an improvement to this type of fault simulation process that makes it even more effective in reducing the test-set size. The proposed improvement allows us to drop tests without simulating them based on the fact that the faults they detect will be detected by tests that will be simulated later, hence the name of the improved procedure: forward-looking fault simulation. We present experimental results to demonstrate the effectiveness of the proposed improvement.
ISSN:0278-0070
1937-4151
DOI:10.1109/43.952743