Thermoreflectance calibration procedure on a laser diode: application to catastrophic optical facet damage analysis

In this letter, we present a thermoreflectance setup specially designed for the study of the temperature variations of the output facet of a laser diode. Indeed, the temperature of the laser diode is controlled by a Peltier element and the device under test is used as a temperature sensor. We propos...

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Bibliographic Details
Published in:IEEE electron device letters 2005-07, Vol.26 (7), p.461-463
Main Authors: Dilhaire, S., Grauby, S., Claeys, W.
Format: Article
Language:English
Subjects:
Applied sciences
Calibration
Damage
Devices
Diode lasers
Diodes
Electric variables measurement
Electrical measurement
Electronics
Exact sciences and technology
Laser diodes
Optical control
Optical design
Optical sensors
Physics
Reliability
Running
Semiconductor electronics. Microelectronics. Optoelectronics. Solid state devices
semiconductor lasers
Temperature control
temperature measurement
Temperature sensors
Testing
Testing, measurement, noise and reliability
Thermoreflectance
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Summary:In this letter, we present a thermoreflectance setup specially designed for the study of the temperature variations of the output facet of a laser diode. Indeed, the temperature of the laser diode is controlled by a Peltier element and the device under test is used as a temperature sensor. We propose a calibration procedure based on electrical measurements combined with optical ones; it leads to the determination of thermoreflectance coefficients and then to absolute temperature variations on a running laser diode. We can hence ensure a proper running of the diode and avoid its catastrophic optical facet damage.
ISSN:0741-3106
1558-0563
DOI:10.1109/LED.2005.851090