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Thermoreflectance calibration procedure on a laser diode: application to catastrophic optical facet damage analysis

In this letter, we present a thermoreflectance setup specially designed for the study of the temperature variations of the output facet of a laser diode. Indeed, the temperature of the laser diode is controlled by a Peltier element and the device under test is used as a temperature sensor. We propos...

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Published in:	IEEE electron device letters 2005-07, Vol.26 (7), p.461-463
Main Authors:	Dilhaire, S., Grauby, S., Claeys, W.
Format:	Article
Language:	English
Subjects:	Applied sciences Calibration Damage Devices Diode lasers Diodes Electric variables measurement Electrical measurement Electronics Exact sciences and technology Laser diodes Optical control Optical design Optical sensors Physics Reliability Running Semiconductor electronics. Microelectronics. Optoelectronics. Solid state devices semiconductor lasers Temperature control temperature measurement Temperature sensors Testing Testing, measurement, noise and reliability Thermoreflectance
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cited_by	cdi_FETCH-LOGICAL-c416t-c3f43b111cdd44c1061293d2fe9d3ad9de48de00a37a41654d93a03c0aaba56a3
cites	cdi_FETCH-LOGICAL-c416t-c3f43b111cdd44c1061293d2fe9d3ad9de48de00a37a41654d93a03c0aaba56a3
container_end_page	463
container_issue	7
container_start_page	461
container_title	IEEE electron device letters
container_volume	26
creator	Dilhaire, S. Grauby, S. Claeys, W.
description	In this letter, we present a thermoreflectance setup specially designed for the study of the temperature variations of the output facet of a laser diode. Indeed, the temperature of the laser diode is controlled by a Peltier element and the device under test is used as a temperature sensor. We propose a calibration procedure based on electrical measurements combined with optical ones; it leads to the determination of thermoreflectance coefficients and then to absolute temperature variations on a running laser diode. We can hence ensure a proper running of the diode and avoid its catastrophic optical facet damage.
doi_str_mv	10.1109/LED.2005.851090
format	article
fullrecord	<record><control><sourceid>proquest_hal_p</sourceid><recordid>TN_cdi_proquest_miscellaneous_1671292909</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><ieee_id>1458956</ieee_id><sourcerecordid>2543587741</sourcerecordid><originalsourceid>FETCH-LOGICAL-c416t-c3f43b111cdd44c1061293d2fe9d3ad9de48de00a37a41654d93a03c0aaba56a3</originalsourceid><addsrcrecordid>eNp9ks2LFDEQxRtRcFw9e_ASBEUPPZvqpD_ibVl3XWHAy3oONUm1kyUzaZMeYf97a-hlFzx4CpX6vaLyXqrqLcg1gDTnm6uv60bKdj20XMpn1Qradqhl26nn1Ur2GmoFsntZvSrlTkrQuterqtzuKO9TpjGSm_HgSDiMYZtxDukgppwc-WMmwQWKiIWy8CF5-iJwmmJwCzcnls1Y5pymXXAiTTO3ohjR0Sw87vEXCTxgvC-hvK5ejBgLvXk4z6qf11e3lzf15se375cXm9pp6ObaqVGrLQA477V2vDs0RvlmJOMVeuNJD56kRNUjC1rtjUKpnETcYtuhOqs-L3N3GO2Uwx7zvU0Y7M3Fxp7uJDvU9Er_AWY_Liy_-PeRymz3oTiKEQ-UjsU2A4BqoWfw039B6HpeszHSMPr-H_QuHTObUKyBRvYKoGHofIFcTqVwDo-bgrSnYC0Ha0_B2iVYVnx4GIuFPR4zpxbKk6wzbFV_4t4tXCCip7ZuB8N_4i-Hhqub</addsrcrecordid><sourcetype>Open Access Repository</sourcetype><iscdi>true</iscdi><recordtype>article</recordtype><pqid>912073112</pqid></control><display><type>article</type><title>Thermoreflectance calibration procedure on a laser diode: application to catastrophic optical facet damage analysis</title><source>IEEE Electronic Library (IEL) Journals</source><creator>Dilhaire, S. ; Grauby, S. ; Claeys, W.</creator><creatorcontrib>Dilhaire, S. ; Grauby, S. ; Claeys, W.</creatorcontrib><description>In this letter, we present a thermoreflectance setup specially designed for the study of the temperature variations of the output facet of a laser diode. Indeed, the temperature of the laser diode is controlled by a Peltier element and the device under test is used as a temperature sensor. We propose a calibration procedure based on electrical measurements combined with optical ones; it leads to the determination of thermoreflectance coefficients and then to absolute temperature variations on a running laser diode. We can hence ensure a proper running of the diode and avoid its catastrophic optical facet damage.</description><identifier>ISSN: 0741-3106</identifier><identifier>EISSN: 1558-0563</identifier><identifier>DOI: 10.1109/LED.2005.851090</identifier><identifier>CODEN: EDLEDZ</identifier><language>eng</language><publisher>New York, NY: IEEE</publisher><subject>Applied sciences ; Calibration ; Damage ; Devices ; Diode lasers ; Diodes ; Electric variables measurement ; Electrical measurement ; Electronics ; Exact sciences and technology ; Laser diodes ; Optical control ; Optical design ; Optical sensors ; Physics ; Reliability ; Running ; Semiconductor electronics. Microelectronics. Optoelectronics. Solid state devices ; semiconductor lasers ; Temperature control ; temperature measurement ; Temperature sensors ; Testing ; Testing, measurement, noise and reliability ; Thermoreflectance</subject><ispartof>IEEE electron device letters, 2005-07, Vol.26 (7), p.461-463</ispartof><rights>2005 INIST-CNRS</rights><rights>Copyright The Institute of Electrical and Electronics Engineers, Inc. (IEEE) 2005</rights><rights>Distributed under a Creative Commons Attribution 4.0 International License</rights><lds50>peer_reviewed</lds50><woscitedreferencessubscribed>false</woscitedreferencessubscribed><citedby>FETCH-LOGICAL-c416t-c3f43b111cdd44c1061293d2fe9d3ad9de48de00a37a41654d93a03c0aaba56a3</citedby><cites>FETCH-LOGICAL-c416t-c3f43b111cdd44c1061293d2fe9d3ad9de48de00a37a41654d93a03c0aaba56a3</cites><orcidid>0000-0002-1172-7788</orcidid></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://ieeexplore.ieee.org/document/1458956$$EHTML$$P50$$Gieee$$H</linktohtml><link.rule.ids>230,314,780,784,885,27924,27925,54796</link.rule.ids><backlink>$$Uhttp://pascal-francis.inist.fr/vibad/index.php?action=getRecordDetail&idt=16910670$$DView record in Pascal Francis$$Hfree_for_read</backlink><backlink>$$Uhttps://hal.science/hal-01552734$$DView record in HAL$$Hfree_for_read</backlink></links><search><creatorcontrib>Dilhaire, S.</creatorcontrib><creatorcontrib>Grauby, S.</creatorcontrib><creatorcontrib>Claeys, W.</creatorcontrib><title>Thermoreflectance calibration procedure on a laser diode: application to catastrophic optical facet damage analysis</title><title>IEEE electron device letters</title><addtitle>LED</addtitle><description>In this letter, we present a thermoreflectance setup specially designed for the study of the temperature variations of the output facet of a laser diode. Indeed, the temperature of the laser diode is controlled by a Peltier element and the device under test is used as a temperature sensor. We propose a calibration procedure based on electrical measurements combined with optical ones; it leads to the determination of thermoreflectance coefficients and then to absolute temperature variations on a running laser diode. We can hence ensure a proper running of the diode and avoid its catastrophic optical facet damage.</description><subject>Applied sciences</subject><subject>Calibration</subject><subject>Damage</subject><subject>Devices</subject><subject>Diode lasers</subject><subject>Diodes</subject><subject>Electric variables measurement</subject><subject>Electrical measurement</subject><subject>Electronics</subject><subject>Exact sciences and technology</subject><subject>Laser diodes</subject><subject>Optical control</subject><subject>Optical design</subject><subject>Optical sensors</subject><subject>Physics</subject><subject>Reliability</subject><subject>Running</subject><subject>Semiconductor electronics. Microelectronics. Optoelectronics. Solid state devices</subject><subject>semiconductor lasers</subject><subject>Temperature control</subject><subject>temperature measurement</subject><subject>Temperature sensors</subject><subject>Testing</subject><subject>Testing, measurement, noise and reliability</subject><subject>Thermoreflectance</subject><issn>0741-3106</issn><issn>1558-0563</issn><fulltext>true</fulltext><rsrctype>article</rsrctype><creationdate>2005</creationdate><recordtype>article</recordtype><recordid>eNp9ks2LFDEQxRtRcFw9e_ASBEUPPZvqpD_ibVl3XWHAy3oONUm1kyUzaZMeYf97a-hlFzx4CpX6vaLyXqrqLcg1gDTnm6uv60bKdj20XMpn1Qradqhl26nn1Ur2GmoFsntZvSrlTkrQuterqtzuKO9TpjGSm_HgSDiMYZtxDukgppwc-WMmwQWKiIWy8CF5-iJwmmJwCzcnls1Y5pymXXAiTTO3ohjR0Sw87vEXCTxgvC-hvK5ejBgLvXk4z6qf11e3lzf15se375cXm9pp6ObaqVGrLQA477V2vDs0RvlmJOMVeuNJD56kRNUjC1rtjUKpnETcYtuhOqs-L3N3GO2Uwx7zvU0Y7M3Fxp7uJDvU9Er_AWY_Liy_-PeRymz3oTiKEQ-UjsU2A4BqoWfw039B6HpeszHSMPr-H_QuHTObUKyBRvYKoGHofIFcTqVwDo-bgrSnYC0Ha0_B2iVYVnx4GIuFPR4zpxbKk6wzbFV_4t4tXCCip7ZuB8N_4i-Hhqub</recordid><startdate>20050701</startdate><enddate>20050701</enddate><creator>Dilhaire, S.</creator><creator>Grauby, S.</creator><creator>Claeys, W.</creator><general>IEEE</general><general>Institute of Electrical and Electronics Engineers</general><general>The Institute of Electrical and Electronics Engineers, Inc. (IEEE)</general><scope>97E</scope><scope>RIA</scope><scope>RIE</scope><scope>IQODW</scope><scope>AAYXX</scope><scope>CITATION</scope><scope>7SP</scope><scope>8FD</scope><scope>L7M</scope><scope>F28</scope><scope>FR3</scope><scope>H8D</scope><scope>1XC</scope><orcidid>https://orcid.org/0000-0002-1172-7788</orcidid></search><sort><creationdate>20050701</creationdate><title>Thermoreflectance calibration procedure on a laser diode: application to catastrophic optical facet damage analysis</title><author>Dilhaire, S. ; Grauby, S. ; Claeys, W.</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-c416t-c3f43b111cdd44c1061293d2fe9d3ad9de48de00a37a41654d93a03c0aaba56a3</frbrgroupid><rsrctype>articles</rsrctype><prefilter>articles</prefilter><language>eng</language><creationdate>2005</creationdate><topic>Applied sciences</topic><topic>Calibration</topic><topic>Damage</topic><topic>Devices</topic><topic>Diode lasers</topic><topic>Diodes</topic><topic>Electric variables measurement</topic><topic>Electrical measurement</topic><topic>Electronics</topic><topic>Exact sciences and technology</topic><topic>Laser diodes</topic><topic>Optical control</topic><topic>Optical design</topic><topic>Optical sensors</topic><topic>Physics</topic><topic>Reliability</topic><topic>Running</topic><topic>Semiconductor electronics. Microelectronics. Optoelectronics. Solid state devices</topic><topic>semiconductor lasers</topic><topic>Temperature control</topic><topic>temperature measurement</topic><topic>Temperature sensors</topic><topic>Testing</topic><topic>Testing, measurement, noise and reliability</topic><topic>Thermoreflectance</topic><toplevel>peer_reviewed</toplevel><toplevel>online_resources</toplevel><creatorcontrib>Dilhaire, S.</creatorcontrib><creatorcontrib>Grauby, S.</creatorcontrib><creatorcontrib>Claeys, W.</creatorcontrib><collection>IEEE All-Society Periodicals Package (ASPP) 2005-present</collection><collection>IEEE All-Society Periodicals Package (ASPP) 1998-Present</collection><collection>IEL</collection><collection>Pascal-Francis</collection><collection>CrossRef</collection><collection>Electronics & Communications Abstracts</collection><collection>Technology Research Database</collection><collection>Advanced Technologies Database with Aerospace</collection><collection>ANTE: Abstracts in New Technology & Engineering</collection><collection>Engineering Research Database</collection><collection>Aerospace Database</collection><collection>Hyper Article en Ligne (HAL)</collection><jtitle>IEEE electron device letters</jtitle></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext</fulltext></delivery><addata><au>Dilhaire, S.</au><au>Grauby, S.</au><au>Claeys, W.</au><format>journal</format><genre>article</genre><ristype>JOUR</ristype><atitle>Thermoreflectance calibration procedure on a laser diode: application to catastrophic optical facet damage analysis</atitle><jtitle>IEEE electron device letters</jtitle><stitle>LED</stitle><date>2005-07-01</date><risdate>2005</risdate><volume>26</volume><issue>7</issue><spage>461</spage><epage>463</epage><pages>461-463</pages><issn>0741-3106</issn><eissn>1558-0563</eissn><coden>EDLEDZ</coden><abstract>In this letter, we present a thermoreflectance setup specially designed for the study of the temperature variations of the output facet of a laser diode. Indeed, the temperature of the laser diode is controlled by a Peltier element and the device under test is used as a temperature sensor. We propose a calibration procedure based on electrical measurements combined with optical ones; it leads to the determination of thermoreflectance coefficients and then to absolute temperature variations on a running laser diode. We can hence ensure a proper running of the diode and avoid its catastrophic optical facet damage.</abstract><cop>New York, NY</cop><pub>IEEE</pub><doi>10.1109/LED.2005.851090</doi><tpages>3</tpages><orcidid>https://orcid.org/0000-0002-1172-7788</orcidid></addata></record>
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language	eng
recordid	cdi_proquest_miscellaneous_1671292909
source	IEEE Electronic Library (IEL) Journals
subjects	Applied sciences Calibration Damage Devices Diode lasers Diodes Electric variables measurement Electrical measurement Electronics Exact sciences and technology Laser diodes Optical control Optical design Optical sensors Physics Reliability Running Semiconductor electronics. Microelectronics. Optoelectronics. Solid state devices semiconductor lasers Temperature control temperature measurement Temperature sensors Testing Testing, measurement, noise and reliability Thermoreflectance
title	Thermoreflectance calibration procedure on a laser diode: application to catastrophic optical facet damage analysis
url	http://sfxeu10.hosted.exlibrisgroup.com/loughborough?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2025-01-04T10%3A40%3A31IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-proquest_hal_p&rft_val_fmt=info:ofi/fmt:kev:mtx:journal&rft.genre=article&rft.atitle=Thermoreflectance%20calibration%20procedure%20on%20a%20laser%20diode:%20application%20to%20catastrophic%20optical%20facet%20damage%20analysis&rft.jtitle=IEEE%20electron%20device%20letters&rft.au=Dilhaire,%20S.&rft.date=2005-07-01&rft.volume=26&rft.issue=7&rft.spage=461&rft.epage=463&rft.pages=461-463&rft.issn=0741-3106&rft.eissn=1558-0563&rft.coden=EDLEDZ&rft_id=info:doi/10.1109/LED.2005.851090&rft_dat=%3Cproquest_hal_p%3E2543587741%3C/proquest_hal_p%3E%3Cgrp_id%3Ecdi_FETCH-LOGICAL-c416t-c3f43b111cdd44c1061293d2fe9d3ad9de48de00a37a41654d93a03c0aaba56a3%3C/grp_id%3E%3Coa%3E%3C/oa%3E%3Curl%3E%3C/url%3E&rft_id=info:oai/&rft_pqid=912073112&rft_id=info:pmid/&rft_ieee_id=1458956&rfr_iscdi=true