A 1-ps Resolution Jitter-Measurement Macro Using Interpolated Jitter Oversampling

This paper reports the development of an in-field real-time successive jitter-measurement macro whose features include 1-ps resolution jitter measurement. The newly developed jitter-measurement macro has four key features: 1) interpolated jitter oversampling; 2) a hierarchical Vernier delay line; an...

Full description

Saved in:
Bibliographic Details
Published in:IEEE journal of solid-state circuits 2006-12, Vol.41 (12), p.2911-2920
Main Authors: Nose, K., Kajita, M., Mizuno, M.
Format: Article
Language:English
Subjects:
Applied sciences
Attenuation measurement
Calibration
Chip formation
Chips
Circuit properties
Circuits
Circuits of signal characteristics conditioning (including delay circuits)
Clocks
Delay lines
Design. Technologies. Operation analysis. Testing
Electric, optical and optoelectronic circuits
Electronic circuits
Electronics
Exact sciences and technology
Histograms
integrated circuit measurement
Integrated circuit measurements
Integrated circuits
Jitter
jitter measurement
Large scale integration
Measurement errors
Noise measurement
Nose
Oversampling
Real time
Semiconductor device measurement
Semiconductor electronics. Microelectronics. Optoelectronics. Solid state devices
Timing jitter
Citations: Items that this one cites
Items that cite this one
Online Access:Get full text
Tags: Add Tag
No Tags, Be the first to tag this record!
Description
Summary:This paper reports the development of an in-field real-time successive jitter-measurement macro whose features include 1-ps resolution jitter measurement. The newly developed jitter-measurement macro has four key features: 1) interpolated jitter oversampling; 2) a hierarchical Vernier delay line; and 3)feedforward calibration, each of which helps attain high jitter-measurement resolution; as well as 4) an oversampling rate and measurement range-control technique. A test chip of the macro has been fabricated in a 90-nm process. It successfully measures small random jitter with 1-ps resolution, and large deterministic jitter can also be measured by extending the jitter-measurement range by a factor of 4
ISSN:0018-9200
1558-173X
DOI:10.1109/JSSC.2006.884402