Ultraviolet and visible Raman analysis of thin a-C films grown by filtered cathodic arc deposition

• Published in: Diamond and related materials 2010-05, Vol.19 (5), p.514-517
• Main Authors: Wasyluk, J., Perova, T.S., Lau, D.W.M., Taylor, M.B., McCulloch, D.G., Stopford, J.
• Format: Article
• Language: English
• Subjects: Amorphous carbon; Arc deposition; Carbon; Condensed matter: electronic structure, electrical, magnetic, and optical properties; Dispersions; Electronic structure and electrical properties of surfaces, interfaces, thin films and low-dimensional structures; Exact sciences and technology; Excitation; Micro-Raman spectroscopy; Physics; Raman spectroscopy; sp 2; sp 3 sites; Surface and interface electron states; Surface double layers, schottky barriers, and work functions; Surface states, band structure, electron density of states; ta-C; Thin films; Ultraviolet; Wavelengths
• ISSN: 0925-9635; 1879-0062
• DOI: 10.1016/j.diamond.2010.01.019

Amorphous carbon thin films with a wide range of sp 2 fraction from 20 to 90% grown by filtered cathodic arc deposition have been examined by ultraviolet (UV) at 325 nm and visible Raman spectroscopy at 457 nm excitation wavelength. The comprehensive study of behaviour of G, D and T band with sp 2/sp 3 content has been carried out. The upwards shift of the G peak with sp 3 content was observed for both excitation wavelengths. It was also found that the I(D)/I(G) ratio decreases with sp 3 content for UV and visible excitations, and for high sp 3 content I(D)/I(G) tends to zero. The dispersion of the G peak is also investigated in this work as a function of sp 2 content.