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Surface-enhanced Raman spectroscopy for trace-level detection of explosives
The detection of explosives and their associated compounds for security screening is an active area of research and a wide variety of detection methods are involved in this very challenging area. Surface‐enhanced Raman scattering (SERS) spectroscopy is one of the most sensitive tools for the detecti...
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Published in: | Journal of Raman spectroscopy 2010-08, Vol.41 (8), p.866-869 |
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Main Authors: | , , |
Format: | Article |
Language: | English |
Subjects: | |
Citations: | Items that this one cites Items that cite this one |
Online Access: | Get full text |
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Summary: | The detection of explosives and their associated compounds for security screening is an active area of research and a wide variety of detection methods are involved in this very challenging area. Surface‐enhanced Raman scattering (SERS) spectroscopy is one of the most sensitive tools for the detection of molecules adsorbed on nano‐scale roughened metal surface. Moreover, SERS combines high sensitivity with the observation of vibrational spectra of species, giving complete information on the molecular structure of material under study. In this paper, SERS was applied to the detection of very small quantities of explosives adsorbed on industrially made substrates. The spectra were acquired with a compact Raman spectrometer. Usually, a high signal‐to‐noise (S/N) spectrum, suitable for identification of explosive molecules down to few hundreds of picograms, was achieved within 30 s. Our measurements suggest that it is possible to exploit SERS using a practical detection instrument for routine analysis. Copyright © 2010 John Wiley & Sons, Ltd.
In this paper, SERS was applied to trace‐level detection of explosives. Usually, a high signal‐to‐noise spectrum, suitable for identification of explosive molecules down to few hundreds of picograms, was achieved within 30 s. These findings confirm the sensitivity and specificity of SERS analysis, enabling its exploitation in a practical detection instrument for routine analysis of security and forensic diagnostics. |
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ISSN: | 0377-0486 1097-4555 1097-4555 |
DOI: | 10.1002/jrs.2649 |