The abnormal direct-current resistivity of Ni–Mn–Ni triple-layered magnetic thin-films and their magnetic wall observations

• Published in: Applied physics. A, Materials science & processing Materials science & processing, 2009-03, Vol.94 (4), p.923-926
• Main Authors: Yeh, Yi-Chen, Chiu, Chun-Han, Lue, Juh Tzeng
• Format: Article
• Language: English
• Subjects: Characterization and Evaluation of Materials; Condensed Matter Physics; Condensed matter: electronic structure, electrical, magnetic, and optical properties; Direct current; Domain structure (including magnetic bubbles); Electrical resistivity; Electron transport; Electronic structure and electrical properties of surfaces, interfaces, thin films and low-dimensional structures; Electronic transport in multilayers, nanoscale materials and structures; Exact sciences and technology; Interlayers; Machines; Magnetic fields; Magnetic properties and materials; Magnetic properties of surface, thin films and multilayers; Manganese; Manufacturing; Nanotechnology; Nickel; Optical and Electronic Materials; Physics; Physics and Astronomy; Processes; Surfaces and Interfaces; Thin Films; Walls
• ISSN: 0947-8396; 1432-0630
• DOI: 10.1007/s00339-008-4862-y

We have observed an abnormal electron transport characteristic from the Ni–Mn–Ni triple-layered magnetic thin-films. Due to the intercalated Mn ultra-thin interlayer, the magnetic domain structure and the electron transport characteristic differ a lot from their original magnetic (Fe, Co, and Ni) films. As inspected by a magnetic force microscopy (MFM), we observed the variation of the domain configuration with Mn interlayer thicknesses (for 1, 5, and 10 nm). Moreover, we also examined and found that the direct current (DC) resistivity have no significant change as the current conducts from the current-in-wall (CIW) to the current- perpendicular-to-wall (CPW), which are opposite to the results of single layered films.