novel method for the measurement of frequency-character of surface resistance of HTS thin film

A novel method for microwave surface resistance measurement of high temperature superconductor thin film at multi-frequency by multimode of sapphire rod is introduced. This method has the advantages of high sensitivity and large dynamic range of the measurement. By using this method, the frequency d...

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Bibliographic Details
Published in:Chinese science bulletin 2010-04, Vol.55 (11), p.1088-1091
Main Authors: Zeng, Cheng, Luo, ZhengXiang, Bu, ShiRong, Yang, Kai, Zhang, QiShao
Format: Article
Language:English
Subjects:
Chemistry/Food Science
Earth Sciences
Engineering
films (materials)
Humanities and Social Sciences
Life Sciences
microwave treatment
multidisciplinary
new methods
Physics
Science
Science (multidisciplinary)
Surface resistance
temperature
Thin films
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Summary:A novel method for microwave surface resistance measurement of high temperature superconductor thin film at multi-frequency by multimode of sapphire rod is introduced. This method has the advantages of high sensitivity and large dynamic range of the measurement. By using this method, the frequency dependent microwave surface resistance of a single piece of high temperature superconductor thin film can be characterized within one temperature cycle. This method is capable of reducing the amount of work in surface resistance measurement and providing supports to the research and the industrialization of high temperature superconductor thin film.
ISSN:1001-6538
1861-9541
DOI:10.1007/s11434-009-0639-8