Ce 5d and Fe 3d magnetic profiles in CeH2/Fe multilayers probed by XRMS

The element and electronic shell specificities of X-ray resonant magnetic scattering have been used to investigate the magnetization of Ce 5d and Fe 3d states in [CeH2(19.6 A)/Fe(25.4 A)]*38 a multilayer. We show that the measurement of the magnetic contribution to the intensities reflected at low a...

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Bibliographic Details
Published in:Applied physics. A, Materials science & processing Materials science & processing, 2001-12, Vol.73 (6), p.711-715
Main Authors: Jaouen, N, Tonnerre, J M, Raoux, D, Ortega, L, Bontempi, E, Munzenberg, M, Felsch, W, Suzuki, M, Maruyama, H, Durr, H A, Dudzik, E, van der Laan, G
Format: Article
Language:English
Subjects:
Angle of reflection
Electronics
Iron
Magnetization
Multilayers
Polarization
Shells
X-rays
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Summary:The element and electronic shell specificities of X-ray resonant magnetic scattering have been used to investigate the magnetization of Ce 5d and Fe 3d states in [CeH2(19.6 A)/Fe(25.4 A)]*38 a multilayer. We show that the measurement of the magnetic contribution to the intensities reflected at low angles at the Ce L2 and Fe L2,3 edges allows us to investigate the profile of the Ce 5d and Fe 3d magnetic polarization. The Fe 3d polarization is found to be uniform across the Fe layer and the Ce 5d polarization appears to be restricted close to the interface with Fe.
ISSN:0947-8396
1432-0630
DOI:10.1007/s003390100966