Optical and structural properties of solution deposited nickel manganite thin films

• Published in: Thin solid films 2011-02, Vol.519 (9), p.2919-2923
• Main Authors: Podraza, N.J., Saint John, D.B., Ko, S.W., Schulze, H.M., Li, J., Dickey, E.C., Trolier-McKinstry, S.
• Format: Article
• Language: English
• Subjects: Condensed matter: electronic structure, electrical, magnetic, and optical properties; Condensed matter: structure, mechanical and thermal properties; Defects and impurities in crystals; microstructure; Deposition; Ellipsometry; Exact sciences and technology; Instruments, apparatus, components and techniques common to several branches of physics and astronomy; Manganites; Mathematical models; Microbolometer; Microorganisms; Microscopic defects (voids, inclusions, etc.); Nickel; Nickel manganite; Optical instruments, equipment and techniques; Optical properties and condensed-matter spectroscopy and other interactions of matter with particles and radiation; Optical properties of specific thin films; Parametrization; Physics; Polarimeters and ellipsometers; Spectroscopic ellipsometry; Structure and morphology; thickness; Structure of solids and liquids; crystallography; Surfaces and interfaces; thin films and whiskers (structure and nonelectronic properties); Thin film structure and morphology; Thin films
• ISSN: 0040-6090; 1879-2731
• DOI: 10.1016/j.tsf.2010.11.088

Nickel manganite thin films of interest for microbolometer applications have been prepared using chemical solution and spin spray deposition and studied using transmission electron microscopy to quantify the material crystallinity and spectroscopic ellipsometry to extract the complex dielectric function (ε=ε1+iε2) and film microstructure. A parameterization for ε over a spectral range from 0.04 to 5.15eV has been developed to model well-crystallized nickel manganite, and the visible-range critical point features, infrared vibrations, and optical absorption onset have been identified. A multiple sample analysis structural model and procedure has been developed for spin spray deposited films exhibiting complicated void evolutions with thickness. Variations in ε and crystallite grain size have been observed as a function of film processing and indicate that the optical properties and microstructural information gained from spectroscopic ellipsometry is useful in process monitoring for this material system.