Study of scattering of conduction electrons in Fe/Cr superlattices by IR magnetoreflection method

Spectral investigations of magnetorefractive effect (MRE) have been performed in p -polarized light in the range of wavelengths λ = 2–13 μm using a series of Fe/Cr superlattices with a variable thicknesses of iron and chromium layers grown by the method of molecular-beam epitaxy. The same samples ha...

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Bibliographic Details
Published in:Physics of metals and metallography 2012-12, Vol.113 (12), p.1153-1161
Main Authors: Lobov, I. D., Kirillova, M. M., Romashev, L. N., Milyaev, M. A., Ustinov, V. V.
Format: Article
Language:English
Subjects:
Analysis
Channels
Chemistry and Materials Science
Chromium
Conduction electrons
Electrical and Magnetic Properties
Electrons
Epitaxy
Iron
Magnetization
Materials Science
Metallic Materials
Methods
Relaxation time
Scattering
Spectra
Superlattices
Toy industry
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Summary:Spectral investigations of magnetorefractive effect (MRE) have been performed in p -polarized light in the range of wavelengths λ = 2–13 μm using a series of Fe/Cr superlattices with a variable thicknesses of iron and chromium layers grown by the method of molecular-beam epitaxy. The same samples have been used to measure the magnetization and the magnetoresistance. Based on an analysis of the MRE spectra, the parameters of the interfacial spin-dependent scattering of conduction electrons (effective relaxation times τ i ↑(↓) , spin asymmetry coefficient γ Fe/Cr(100) , and scattering probabilities P i ↑(↓) ) have been determined in terms of the magnetoreflection theory for multilayer structures with different thicknesses of chromium layers. It has been found that the changes in the parameters of the interfacial scattering of conduction electrons occur with increasing chromium-layer thickness primarily in the (↓)-current channel.
ISSN:0031-918X
1555-6190
DOI:10.1134/S0031918X12120071