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Morphological evolution of thin gold films studied by Auger electron spectroscopy in beading conditions

The evolution of thin gold films deposited on a sapphire surface was studied in UHV using Auger electron spectroscopy and atomic force microscopy techniques. The annealing temperatures were in the range 573--843 K. Starting from a continuous film, we observed at the end of the process a collection o...

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Bibliographic Details
Published in:Applied physics. A, Materials science & processing Materials science & processing, 2004-04, Vol.78 (7), p.1079-1084
Main Authors: BESZEDA, I, SZABO, I. A, GONTIER-MOYA, E. G
Format: Article
Language:English
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Summary:The evolution of thin gold films deposited on a sapphire surface was studied in UHV using Auger electron spectroscopy and atomic force microscopy techniques. The annealing temperatures were in the range 573--843 K. Starting from a continuous film, we observed at the end of the process a collection of beads. The incubation time in this temperature range was negligible, while the agglomeration time varied from about 2 h at 573 K to a few minutes at 843 K. The kinetics of metal agglomeration allowed the evaluation of the surface self diffusion coefficients of gold which can be expressed by
ISSN:0947-8396
1432-0630
DOI:10.1007/s00339-003-2170-0