Non-interferometric transient quantitative phase microscopy for ultrafast engineering

The accelerating developments in micro- & nanotechnology require faster and more precise tools for application and diagnostics. A new ultra-fast diagnostics is presented as an advancement of a conventional phase microscopy method (Iatia QPm TM ). Contrary to the conventional method using one CCD...

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Bibliographic Details
Published in:Applied physics. A, Materials science & processing Materials science & processing, 2008-10, Vol.93 (1), p.165-169
Main Authors: Horn, Alexander, Mingareev, Ilja, Werth, Alexander, Kachel, Martin, Brenk, Udo
Format: Article
Language:English
Subjects:
Ablation
Characterization and Evaluation of Materials
Charge coupled devices
Condensed Matter Physics
Delay lines
Diagnostic software
Lasers
Machines
Manufacturing
Melts
Microscopy
Nanotechnology
Optical and Electronic Materials
Physics
Physics and Astronomy
Planes
Processes
Surfaces and Interfaces
Thin Films
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Summary:The accelerating developments in micro- & nanotechnology require faster and more precise tools for application and diagnostics. A new ultra-fast diagnostics is presented as an advancement of a conventional phase microscopy method (Iatia QPm TM ). Contrary to the conventional method using one CCD to detect three object planes, three CCDs detect these planes separately. This concept, named TQPm, has been analyzed and validated by measuring the phase of a commercial fiber. This new method has been implemented into a pump&probe set-up with an ultra-long delay line (Δ t
ISSN:0947-8396
1432-0630
DOI:10.1007/s00339-008-4657-1