High-Contrast Imaging of Graphene via Time-Domain Terahertz Spectroscopy

We demonstrate terahertz (THz) imaging and spectroscopy of single-layer graphene deposited on an intrinsic Si substrate using THz time-domain spectroscopy. A single-cycle THz pulse undergoes multiple internal reflections within the Si substrate, and the THz absorption by the graphene layer accumulat...

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Bibliographic Details
Published in:Journal of infrared, millimeter and terahertz waves millimeter and terahertz waves, 2012-08, Vol.33 (8), p.839-845
Main Authors: Tomaino, J. L., Jameson, A. D., Paul, M. J., Kevek, J. W., van der Zande, A. M., Barton, R. A., Choi, H., McEuen, P. L., Minot, E. D., Lee, Yun-Shik
Format: Article
Language:English
Subjects:
Absorption
Classical Electrodynamics
Deposition
Electrical Engineering
Electronics and Microelectronics
Engineering
Graphene
Image acquisition
Image contrast
Imaging
Infrared
Instrumentation
Reflection
Silicon substrates
Spectroscopy
Spectrum analysis
Thin films
Time domain analysis
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Summary:We demonstrate terahertz (THz) imaging and spectroscopy of single-layer graphene deposited on an intrinsic Si substrate using THz time-domain spectroscopy. A single-cycle THz pulse undergoes multiple internal reflections within the Si substrate, and the THz absorption by the graphene layer accumulates through the multiple interactions with the graphene/Si interface. We exploit the large absorption of the multiply reflected THz pulses to acquire high-contrast THz images of graphene. We obtain local sheet conductivity of the graphene layer analyzing the transmission data with thin-film Fresnel formula based on the Drude model.
ISSN:1866-6892
1866-6906
DOI:10.1007/s10762-012-9889-7