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High-Contrast Imaging of Graphene via Time-Domain Terahertz Spectroscopy
We demonstrate terahertz (THz) imaging and spectroscopy of single-layer graphene deposited on an intrinsic Si substrate using THz time-domain spectroscopy. A single-cycle THz pulse undergoes multiple internal reflections within the Si substrate, and the THz absorption by the graphene layer accumulat...
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| Published in: | Journal of infrared, millimeter and terahertz waves millimeter and terahertz waves, 2012-08, Vol.33 (8), p.839-845 |
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| Main Authors: | , , , , , , , , , |
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| Language: | English |
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| cited_by | cdi_FETCH-LOGICAL-c349t-dd7c99656cca29a9720751baaacd8878284d18cb2137a07530cf70e0acf2e9c63 |
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| cites | cdi_FETCH-LOGICAL-c349t-dd7c99656cca29a9720751baaacd8878284d18cb2137a07530cf70e0acf2e9c63 |
| container_end_page | 845 |
| container_issue | 8 |
| container_start_page | 839 |
| container_title | Journal of infrared, millimeter and terahertz waves |
| container_volume | 33 |
| creator | Tomaino, J. L. Jameson, A. D. Paul, M. J. Kevek, J. W. van der Zande, A. M. Barton, R. A. Choi, H. McEuen, P. L. Minot, E. D. Lee, Yun-Shik |
| description | We demonstrate terahertz (THz) imaging and spectroscopy of single-layer graphene deposited on an intrinsic Si substrate using THz time-domain spectroscopy. A single-cycle THz pulse undergoes multiple internal reflections within the Si substrate, and the THz absorption by the graphene layer accumulates through the multiple interactions with the graphene/Si interface. We exploit the large absorption of the multiply reflected THz pulses to acquire high-contrast THz images of graphene. We obtain local sheet conductivity of the graphene layer analyzing the transmission data with thin-film Fresnel formula based on the Drude model. |
| doi_str_mv | 10.1007/s10762-012-9889-7 |
| format | article |
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L. ; Jameson, A. D. ; Paul, M. J. ; Kevek, J. W. ; van der Zande, A. M. ; Barton, R. A. ; Choi, H. ; McEuen, P. L. ; Minot, E. D. ; Lee, Yun-Shik</creator><creatorcontrib>Tomaino, J. L. ; Jameson, A. D. ; Paul, M. J. ; Kevek, J. W. ; van der Zande, A. M. ; Barton, R. A. ; Choi, H. ; McEuen, P. L. ; Minot, E. D. ; Lee, Yun-Shik</creatorcontrib><description>We demonstrate terahertz (THz) imaging and spectroscopy of single-layer graphene deposited on an intrinsic Si substrate using THz time-domain spectroscopy. A single-cycle THz pulse undergoes multiple internal reflections within the Si substrate, and the THz absorption by the graphene layer accumulates through the multiple interactions with the graphene/Si interface. We exploit the large absorption of the multiply reflected THz pulses to acquire high-contrast THz images of graphene. We obtain local sheet conductivity of the graphene layer analyzing the transmission data with thin-film Fresnel formula based on the Drude model.</description><identifier>ISSN: 1866-6892</identifier><identifier>EISSN: 1866-6906</identifier><identifier>DOI: 10.1007/s10762-012-9889-7</identifier><language>eng</language><publisher>Boston: Springer US</publisher><subject>Absorption ; Classical Electrodynamics ; Deposition ; Electrical Engineering ; Electronics and Microelectronics ; Engineering ; Graphene ; Image acquisition ; Image contrast ; Imaging ; Infrared ; Instrumentation ; Reflection ; Silicon substrates ; Spectroscopy ; Spectrum analysis ; Thin films ; Time domain analysis</subject><ispartof>Journal of infrared, millimeter and terahertz waves, 2012-08, Vol.33 (8), p.839-845</ispartof><rights>Springer Science+Business Media, LLC 2012</rights><rights>Journal of Infrared, Millimeter, and Terahertz Waves is a copyright of Springer, (2012). All Rights Reserved.</rights><lds50>peer_reviewed</lds50><woscitedreferencessubscribed>false</woscitedreferencessubscribed><citedby>FETCH-LOGICAL-c349t-dd7c99656cca29a9720751baaacd8878284d18cb2137a07530cf70e0acf2e9c63</citedby><cites>FETCH-LOGICAL-c349t-dd7c99656cca29a9720751baaacd8878284d18cb2137a07530cf70e0acf2e9c63</cites></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><link.rule.ids>314,780,784,27924,27925</link.rule.ids></links><search><creatorcontrib>Tomaino, J. L.</creatorcontrib><creatorcontrib>Jameson, A. D.</creatorcontrib><creatorcontrib>Paul, M. J.</creatorcontrib><creatorcontrib>Kevek, J. W.</creatorcontrib><creatorcontrib>van der Zande, A. M.</creatorcontrib><creatorcontrib>Barton, R. A.</creatorcontrib><creatorcontrib>Choi, H.</creatorcontrib><creatorcontrib>McEuen, P. L.</creatorcontrib><creatorcontrib>Minot, E. D.</creatorcontrib><creatorcontrib>Lee, Yun-Shik</creatorcontrib><title>High-Contrast Imaging of Graphene via Time-Domain Terahertz Spectroscopy</title><title>Journal of infrared, millimeter and terahertz waves</title><addtitle>J Infrared Milli Terahz Waves</addtitle><description>We demonstrate terahertz (THz) imaging and spectroscopy of single-layer graphene deposited on an intrinsic Si substrate using THz time-domain spectroscopy. A single-cycle THz pulse undergoes multiple internal reflections within the Si substrate, and the THz absorption by the graphene layer accumulates through the multiple interactions with the graphene/Si interface. We exploit the large absorption of the multiply reflected THz pulses to acquire high-contrast THz images of graphene. We obtain local sheet conductivity of the graphene layer analyzing the transmission data with thin-film Fresnel formula based on the Drude model.</description><subject>Absorption</subject><subject>Classical Electrodynamics</subject><subject>Deposition</subject><subject>Electrical Engineering</subject><subject>Electronics and Microelectronics</subject><subject>Engineering</subject><subject>Graphene</subject><subject>Image acquisition</subject><subject>Image contrast</subject><subject>Imaging</subject><subject>Infrared</subject><subject>Instrumentation</subject><subject>Reflection</subject><subject>Silicon substrates</subject><subject>Spectroscopy</subject><subject>Spectrum analysis</subject><subject>Thin films</subject><subject>Time domain analysis</subject><issn>1866-6892</issn><issn>1866-6906</issn><fulltext>true</fulltext><rsrctype>article</rsrctype><creationdate>2012</creationdate><recordtype>article</recordtype><recordid>eNp1kF1LwzAUhoMoOKc_wLuCN95Ek7TNx6VM3QYDL5zX4SxNu461qUkrzF9vRhVB8CoH8rwv5zwIXVNyRwkR94ESwRkmlGElpcLiBE2o5BxzRfjpzywVO0cXIewI4Vmm-AQtFnW1xTPX9h5CnywbqOq2SlyZzD10W9va5KOGZF03Fj-6Buo2WVsPW-v7z-S1s6b3LhjXHS7RWQn7YK--3yl6e35azxZ49TJfzh5W2KSZ6nFRCKMUz7kxwBQowYjI6QYATCGlkExmBZVmw2gqIH6lxJSCWAKmZFYZnk7R7djbefc-2NDrpg7G7vfQWjcETbmgWS45ZRG9-YPu3ODbuJ1mLFexnPIjRUfKxEuCt6XufN2AP2hK9NGtHt3q6FYf3WoRM2zMhMi2lfW_zf-HvgDLkntF</recordid><startdate>20120801</startdate><enddate>20120801</enddate><creator>Tomaino, J. 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| identifier | ISSN: 1866-6892 |
| ispartof | Journal of infrared, millimeter and terahertz waves, 2012-08, Vol.33 (8), p.839-845 |
| issn | 1866-6892 1866-6906 |
| language | eng |
| recordid | cdi_proquest_miscellaneous_1671458612 |
| source | Springer Nature |
| subjects | Absorption Classical Electrodynamics Deposition Electrical Engineering Electronics and Microelectronics Engineering Graphene Image acquisition Image contrast Imaging Infrared Instrumentation Reflection Silicon substrates Spectroscopy Spectrum analysis Thin films Time domain analysis |
| title | High-Contrast Imaging of Graphene via Time-Domain Terahertz Spectroscopy |
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