Direct and quantitative broadband absorptance spectroscopy on small objects using Fourier transform infrared spectrometer and bilayer cantilever probes

A measurement platform is introduced that combines a bilayer cantilever probe with a Fourier transform infrared spectrometer to measure absolute spectral absorptance between wavelengths of 3 μm and 18 μm directly and quantitatively. The enhanced sensitivity provided by the cantilever probe enables t...

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Bibliographic Details
Published in:Applied physics letters 2013-02, Vol.102 (5)
Main Authors: Hsu, Wei-Chun, Tong, Jonathan K., Liao, Bolin, Burg, Brian R., Chen, Gang
Format: Article
Language:English
Subjects:
Absorptance
Absorptivity
Fourier transforms
Infrared spectrometers
Nanoparticles
Nanowires
Silicon films
Spectra
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Summary:A measurement platform is introduced that combines a bilayer cantilever probe with a Fourier transform infrared spectrometer to measure absolute spectral absorptance between wavelengths of 3 μm and 18 μm directly and quantitatively. The enhanced sensitivity provided by the cantilever probe enables the quantitative characterization of micro- and nanometer-sized samples. Validation of the technique is carried out by measuring the absorptance spectrum of a doped silicon thin film with a backside aluminum layer and found to agree well with the theoretical predictions. The presented technique is especially attractive for samples such as individual nanowires or nanoparticles, isolated molecules, powders, and photonic structures.
ISSN:0003-6951
1077-3118
DOI:10.1063/1.4790184