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On the limitations of transimpedance amplifiers as tools for low-frequency noise characterization
An experimental set-up for the characterization of low-frequency noise on two terminal devices is reported. The experimental set-up is based on the use of the commercial transimpedance amplifier (TA) EG&G5182. This paper addresses the influence of the TA on the noise characterization process by...
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Published in: | Microelectronics 2014-02, Vol.45 (2), p.152-158 |
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creator | Borgarino, Mattia Betti Beneventi, Giovanni Doga, Valerio Pavan, Paolo |
description | An experimental set-up for the characterization of low-frequency noise on two terminal devices is reported. The experimental set-up is based on the use of the commercial transimpedance amplifier (TA) EG&G5182. This paper addresses the influence of the TA on the noise characterization process by describing the TA as a non-ideal operational amplifier with a feedback resistor. The impact of the TA finite input resistance and voltage gain is highlighted through comparison with measurements carried out on resistors and diodes.
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•Analysis of the intrinsic limitations of a low-frequency noise experimental set-up.•Analysis of transimpedance amplifiers as tools for noise characterization.•Noise characterization.•Noise modeling.•Guidelines for robust and reliable electrical characterization of noise phenomena. |
doi_str_mv | 10.1016/j.mejo.2013.12.007 |
format | article |
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[Display omitted]
•Analysis of the intrinsic limitations of a low-frequency noise experimental set-up.•Analysis of transimpedance amplifiers as tools for noise characterization.•Noise characterization.•Noise modeling.•Guidelines for robust and reliable electrical characterization of noise phenomena.</description><identifier>ISSN: 1879-2391</identifier><identifier>ISSN: 0026-2692</identifier><identifier>EISSN: 1879-2391</identifier><identifier>DOI: 10.1016/j.mejo.2013.12.007</identifier><language>eng</language><publisher>Elsevier Ltd</publisher><subject>Amplifiers ; Diodes ; Electrical characterization ; Low-frequency noise ; Mathematical analysis ; Noise ; Noise characterization ; Noise modeling ; Resistors ; Semiconductor device reliability ; Tantalum ; Terminals ; Transimpedance amplifier ; Voltage gain</subject><ispartof>Microelectronics, 2014-02, Vol.45 (2), p.152-158</ispartof><rights>2013 Elsevier Ltd</rights><woscitedreferencessubscribed>false</woscitedreferencessubscribed><cites>FETCH-LOGICAL-c284t-488a8d3910948a6af598eaf09d57646e6f12f949a820aa2eef100f239ee3c6203</cites><orcidid>0000-0002-3913-1812</orcidid></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><link.rule.ids>314,780,784,27924,27925</link.rule.ids></links><search><creatorcontrib>Borgarino, Mattia</creatorcontrib><creatorcontrib>Betti Beneventi, Giovanni</creatorcontrib><creatorcontrib>Doga, Valerio</creatorcontrib><creatorcontrib>Pavan, Paolo</creatorcontrib><title>On the limitations of transimpedance amplifiers as tools for low-frequency noise characterization</title><title>Microelectronics</title><description>An experimental set-up for the characterization of low-frequency noise on two terminal devices is reported. The experimental set-up is based on the use of the commercial transimpedance amplifier (TA) EG&G5182. This paper addresses the influence of the TA on the noise characterization process by describing the TA as a non-ideal operational amplifier with a feedback resistor. The impact of the TA finite input resistance and voltage gain is highlighted through comparison with measurements carried out on resistors and diodes.
[Display omitted]
•Analysis of the intrinsic limitations of a low-frequency noise experimental set-up.•Analysis of transimpedance amplifiers as tools for noise characterization.•Noise characterization.•Noise modeling.•Guidelines for robust and reliable electrical characterization of noise phenomena.</description><subject>Amplifiers</subject><subject>Diodes</subject><subject>Electrical characterization</subject><subject>Low-frequency noise</subject><subject>Mathematical analysis</subject><subject>Noise</subject><subject>Noise characterization</subject><subject>Noise modeling</subject><subject>Resistors</subject><subject>Semiconductor device reliability</subject><subject>Tantalum</subject><subject>Terminals</subject><subject>Transimpedance amplifier</subject><subject>Voltage gain</subject><issn>1879-2391</issn><issn>0026-2692</issn><issn>1879-2391</issn><fulltext>true</fulltext><rsrctype>article</rsrctype><creationdate>2014</creationdate><recordtype>article</recordtype><recordid>eNp9kDtPwzAUhSMEEqXwB5g8siTYzsuWWFDFS6rUBWbryrlWHSVxsF1Q-fW4lIGJ6d7hnKNzviy7ZrRglDW3fTFi7wpOWVkwXlDanmQLJlqZ81Ky0z__eXYRQk8prVteLTLYTCRukQx2tBGidVMgzpDoYQp2nLGDSSOBcR6ssegDgUCic0MgxnkyuM_ceHzf4aT3ZHI2INFb8KAjevv1k3eZnRkYAl793mX29vjwunrO15unl9X9OtdcVDGvhADRpYJUVgIaMLUUCIbKrm6bqsHGMG5kJUFwCsARDaPUpEWIpW44LZfZzTF39i4VClGNNmgcBpjQ7YJiTctqXgvZJik_SrV3IXg0avZ2BL9XjKoDT9WrA0914KkYV4lnMt0dTZhGfCQWKmibdmNnPeqoOmf_s38D9qmARg</recordid><startdate>20140201</startdate><enddate>20140201</enddate><creator>Borgarino, Mattia</creator><creator>Betti Beneventi, Giovanni</creator><creator>Doga, Valerio</creator><creator>Pavan, Paolo</creator><general>Elsevier Ltd</general><scope>AAYXX</scope><scope>CITATION</scope><scope>7SP</scope><scope>8FD</scope><scope>L7M</scope><orcidid>https://orcid.org/0000-0002-3913-1812</orcidid></search><sort><creationdate>20140201</creationdate><title>On the limitations of transimpedance amplifiers as tools for low-frequency noise characterization</title><author>Borgarino, Mattia ; Betti Beneventi, Giovanni ; Doga, Valerio ; Pavan, Paolo</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-c284t-488a8d3910948a6af598eaf09d57646e6f12f949a820aa2eef100f239ee3c6203</frbrgroupid><rsrctype>articles</rsrctype><prefilter>articles</prefilter><language>eng</language><creationdate>2014</creationdate><topic>Amplifiers</topic><topic>Diodes</topic><topic>Electrical characterization</topic><topic>Low-frequency noise</topic><topic>Mathematical analysis</topic><topic>Noise</topic><topic>Noise characterization</topic><topic>Noise modeling</topic><topic>Resistors</topic><topic>Semiconductor device reliability</topic><topic>Tantalum</topic><topic>Terminals</topic><topic>Transimpedance amplifier</topic><topic>Voltage gain</topic><toplevel>online_resources</toplevel><creatorcontrib>Borgarino, Mattia</creatorcontrib><creatorcontrib>Betti Beneventi, Giovanni</creatorcontrib><creatorcontrib>Doga, Valerio</creatorcontrib><creatorcontrib>Pavan, Paolo</creatorcontrib><collection>CrossRef</collection><collection>Electronics & Communications Abstracts</collection><collection>Technology Research Database</collection><collection>Advanced Technologies Database with Aerospace</collection><jtitle>Microelectronics</jtitle></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext</fulltext></delivery><addata><au>Borgarino, Mattia</au><au>Betti Beneventi, Giovanni</au><au>Doga, Valerio</au><au>Pavan, Paolo</au><format>journal</format><genre>article</genre><ristype>JOUR</ristype><atitle>On the limitations of transimpedance amplifiers as tools for low-frequency noise characterization</atitle><jtitle>Microelectronics</jtitle><date>2014-02-01</date><risdate>2014</risdate><volume>45</volume><issue>2</issue><spage>152</spage><epage>158</epage><pages>152-158</pages><issn>1879-2391</issn><issn>0026-2692</issn><eissn>1879-2391</eissn><abstract>An experimental set-up for the characterization of low-frequency noise on two terminal devices is reported. The experimental set-up is based on the use of the commercial transimpedance amplifier (TA) EG&G5182. This paper addresses the influence of the TA on the noise characterization process by describing the TA as a non-ideal operational amplifier with a feedback resistor. The impact of the TA finite input resistance and voltage gain is highlighted through comparison with measurements carried out on resistors and diodes.
[Display omitted]
•Analysis of the intrinsic limitations of a low-frequency noise experimental set-up.•Analysis of transimpedance amplifiers as tools for noise characterization.•Noise characterization.•Noise modeling.•Guidelines for robust and reliable electrical characterization of noise phenomena.</abstract><pub>Elsevier Ltd</pub><doi>10.1016/j.mejo.2013.12.007</doi><tpages>7</tpages><orcidid>https://orcid.org/0000-0002-3913-1812</orcidid></addata></record> |
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subjects | Amplifiers Diodes Electrical characterization Low-frequency noise Mathematical analysis Noise Noise characterization Noise modeling Resistors Semiconductor device reliability Tantalum Terminals Transimpedance amplifier Voltage gain |
title | On the limitations of transimpedance amplifiers as tools for low-frequency noise characterization |
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