Novel approaches in the SR beamline design

High brightness third generation x-ray sources bring new experimental possibilities and impose new challenges. Coherent scattering and diffraction-limited microscopy require wave-preserving optics, high-resolution inelastic scattering novel optical elements, where x-ray interferometry or the require...

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Bibliographic Details
Published in:Nuclear instruments & methods in physics research. Section A, Accelerators, spectrometers, detectors and associated equipment Accelerators, spectrometers, detectors and associated equipment, 2013-05, Vol.710, p.161-165
Main Authors: Kaznatcheev, K., Idir, M., Chubar, O.
Format: Article
Language:English
Subjects:
Accelerators
Coherent scattering
Diffraction
Inelastic scattering
Microscopy
Particle physics
Synchrotron radiation beamline design
X-ray interferometry
X-ray sources
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Description
Summary:High brightness third generation x-ray sources bring new experimental possibilities and impose new challenges. Coherent scattering and diffraction-limited microscopy require wave-preserving optics, high-resolution inelastic scattering novel optical elements, where x-ray interferometry or the requirements of precise polarization measurements change the optical layout. With NSLS-II development as an illustration we discuss recent trends in beamline design.
ISSN:0168-9002
1872-9576
DOI:10.1016/j.nima.2012.11.090