Electron attachment rate constant measurement by photoemission electron attachment ion mobility spectrometry (PE-EA-IMS)

Photoemission electron attachment ion mobility spectrometry (PE-EA-IMS), with a source of photoelectrons induced by vacuum ultraviolet radiation on a metal surface, has been developed to study electron attachment reaction at atmospheric pressure using nitrogen as the buffer gas. Based on the negativ...

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Bibliographic Details
Published in:Radiation physics and chemistry (Oxford, England : 1993) England : 1993), 2012-12, Vol.81 (12), p.1869-1873
Main Authors: Su, Desheng, Niu, Wenqi, Liu, Sheng, Shen, Chengyin, Huang, Chaoqun, Wang, Hongmei, Jiang, Haihe, Chu, Yannan
Format: Article
Language:English
Subjects:
Chlorinated methane
Electron attachment
Electron energy
Ion mobility
Ion mobility spectrometry
Ionic mobility
Photoelectron source
Photoemission
Rate constant
Rate constants
Spectrometry
Spectroscopy
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Summary:Photoemission electron attachment ion mobility spectrometry (PE-EA-IMS), with a source of photoelectrons induced by vacuum ultraviolet radiation on a metal surface, has been developed to study electron attachment reaction at atmospheric pressure using nitrogen as the buffer gas. Based on the negative ion mobility spectra, the rate constants for electron attachment to tetrachloromethane and chloroform were measured at ambient temperature as a function of the average electron energy in the range from 0.29 to 0.96eV. The experimental results are in good agreement with the data reported in the literature. ► Photoemission electron attachment ion mobility spectrometry (PE-EA-IMS) was developed to study electron attachment reaction. ► The rate constants of electron attachment to CCl4 and CHCl3 were determined. ► The present experimental results are in good agreement with the previously reported data.
ISSN:0969-806X
1879-0895
DOI:10.1016/j.radphyschem.2012.07.005