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Mechanical milled doped Zn-based semiconductors powders for photovoltaic devices
Structural characterization of nanocrystalline Al-doped ZnTe semiconductors, obtained by mechanical milling from ZnTe and Al2O3 powders, is presented. The samples were analyzed by X-ray diffraction (XRD), scanning electron microscopy (SEM), X-ray absorption full spectroscopy (XAFS) and positron anni...
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Published in: | International journal of hydrogen energy 2014-05, Vol.39 (16), p.8697-8701 |
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Main Authors: | , , , , |
Format: | Article |
Language: | English |
Subjects: | |
Citations: | Items that this one cites Items that cite this one |
Online Access: | Get full text |
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Summary: | Structural characterization of nanocrystalline Al-doped ZnTe semiconductors, obtained by mechanical milling from ZnTe and Al2O3 powders, is presented. The samples were analyzed by X-ray diffraction (XRD), scanning electron microscopy (SEM), X-ray absorption full spectroscopy (XAFS) and positron annihilation lifetime (PALS) measurements. The results suggested that Al atoms are substitutional incorporated into the ZnTe cubic structure.
•Mechanical milling is a simple, cheap and effective method to obtain nanostructures.•Al-doped zinc telluride powders were successfully obtained.•X-ray diffraction and XAFS studies show Al incorporation in crystalline structure.•PALS became an effective tool to sense dopant incorporation into ZnTe power.•Average positron lifetime is a good parameter to analyze changes with milling time. |
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ISSN: | 0360-3199 1879-3487 |
DOI: | 10.1016/j.ijhydene.2013.12.051 |