Direct Measurement of Vanadium Dioxide Dielectric Properties in W-band

In this paper we directly measure the refractive index and extinction coefficient of vanadium dioxide (VO 2 ) in W-band (75-110 GHz) near the insulator-to-metal phase transition. A frequency-domain interferometry setup is used to obtain the transmission amplitude and phase shift of a transmitted wav...

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Bibliographic Details
Published in:Journal of infrared, millimeter and terahertz waves millimeter and terahertz waves, 2014-05, Vol.35 (5), p.486-492
Main Authors: Hashemi, Mohammed Reza M., Berry, Christopher W., Merced, Emmanuelle, Sepúlveda, Nelson, Jarrahi, Mona
Format: Article
Language:English
Subjects:
Classical Electrodynamics
Coefficients
Dielectric properties
Electrical Engineering
Electronics and Microelectronics
Engineering
Extinction
Instrumentation
Oxygen consumption
Phase transitions
Refractive index
Refractivity
Silicon substrates
Transition temperature
Tungsten
Vanadium dioxide
Vanadium oxides
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Summary:In this paper we directly measure the refractive index and extinction coefficient of vanadium dioxide (VO 2 ) in W-band (75-110 GHz) near the insulator-to-metal phase transition. A frequency-domain interferometry setup is used to obtain the transmission amplitude and phase shift of a transmitted wave though a 200 nm-thick VO 2 film deposited on a silicon substrate. Using the transmission matrix technique, the measured data in the 58-100 °C temperature range are used to obtain the refractive index and extinction coefficient of VO 2 as a function of temperature and frequency. The experimental results show a significant increase in the refractive index and extinction coefficient of VO 2 beyond the transition temperature of ~68 °C.
ISSN:1866-6892
1866-6906
DOI:10.1007/s10762-014-0065-0