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The effect of hydrogen annealing on the molybdenum doped ZnO thin film
The electrical characteristics of hydrogen annealing on the molybdenum doped ZnO (MZO) thin film were discussed in the paper. The MZO film was deposited by an radio frequency sputtering, then it was annealed in hydrogen with a microwave plasma chemical vapor deposition system. The resistivity of MZO...
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Published in: | Journal of materials science. Materials in electronics 2014-05, Vol.25 (5), p.2138-2142 |
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creator | Lin, Tien-Chai Huang, Wen-Feng Huang, Wen-Chang |
description | The electrical characteristics of hydrogen annealing on the molybdenum doped ZnO (MZO) thin film were discussed in the paper. The MZO film was deposited by an radio frequency sputtering, then it was annealed in hydrogen with a microwave plasma chemical vapor deposition system. The resistivity of MZO was decreased from 1.1 × 10
−2
to 9.5 × 10
−3
Ω cm after the hydrogen annealing. Improvements of the electrical properties are both due to the defects repairing through annealing and hydrogen doping effects of the MZO thin film. The higher temperature annealed MZO film shows slightly lower transmittance which is due to the higher carrier concentration. |
doi_str_mv | 10.1007/s10854-014-1850-1 |
format | article |
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−2
to 9.5 × 10
−3
Ω cm after the hydrogen annealing. Improvements of the electrical properties are both due to the defects repairing through annealing and hydrogen doping effects of the MZO thin film. The higher temperature annealed MZO film shows slightly lower transmittance which is due to the higher carrier concentration.</description><identifier>ISSN: 0957-4522</identifier><identifier>EISSN: 1573-482X</identifier><identifier>DOI: 10.1007/s10854-014-1850-1</identifier><language>eng</language><publisher>Boston: Springer US</publisher><subject>Annealing ; Characterization and Evaluation of Materials ; Chemistry and Materials Science ; Deposition ; Electrical resistivity ; Materials Science ; Molybdenum ; Optical and Electronic Materials ; Repairing ; Thin films ; Transmittance ; Zinc oxide</subject><ispartof>Journal of materials science. Materials in electronics, 2014-05, Vol.25 (5), p.2138-2142</ispartof><rights>Springer Science+Business Media New York 2014</rights><lds50>peer_reviewed</lds50><woscitedreferencessubscribed>false</woscitedreferencessubscribed><citedby>FETCH-LOGICAL-c349t-455062a991f73a3d817db7f65e4bf725506e1e5f42d04e29800354eea0fc116d3</citedby><cites>FETCH-LOGICAL-c349t-455062a991f73a3d817db7f65e4bf725506e1e5f42d04e29800354eea0fc116d3</cites></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><link.rule.ids>314,780,784,27924,27925</link.rule.ids></links><search><creatorcontrib>Lin, Tien-Chai</creatorcontrib><creatorcontrib>Huang, Wen-Feng</creatorcontrib><creatorcontrib>Huang, Wen-Chang</creatorcontrib><title>The effect of hydrogen annealing on the molybdenum doped ZnO thin film</title><title>Journal of materials science. Materials in electronics</title><addtitle>J Mater Sci: Mater Electron</addtitle><description>The electrical characteristics of hydrogen annealing on the molybdenum doped ZnO (MZO) thin film were discussed in the paper. The MZO film was deposited by an radio frequency sputtering, then it was annealed in hydrogen with a microwave plasma chemical vapor deposition system. The resistivity of MZO was decreased from 1.1 × 10
−2
to 9.5 × 10
−3
Ω cm after the hydrogen annealing. Improvements of the electrical properties are both due to the defects repairing through annealing and hydrogen doping effects of the MZO thin film. The higher temperature annealed MZO film shows slightly lower transmittance which is due to the higher carrier concentration.</description><subject>Annealing</subject><subject>Characterization and Evaluation of Materials</subject><subject>Chemistry and Materials Science</subject><subject>Deposition</subject><subject>Electrical resistivity</subject><subject>Materials Science</subject><subject>Molybdenum</subject><subject>Optical and Electronic Materials</subject><subject>Repairing</subject><subject>Thin films</subject><subject>Transmittance</subject><subject>Zinc oxide</subject><issn>0957-4522</issn><issn>1573-482X</issn><fulltext>true</fulltext><rsrctype>article</rsrctype><creationdate>2014</creationdate><recordtype>article</recordtype><recordid>eNp1kE1Lw0AURQdRsFZ_gLsBN26i8-YryVKKVaHQTQVxM0yTN21KMlMz6aL_3ilxIYKrt7jnXh6HkFtgD8BY_hiBFUpmDGQGhWIZnJEJqFxksuAf52TCSpVnUnF-Sa5i3DHGtBTFhMxXW6ToHFYDDY5uj3UfNuip9R5t2_gNDZ4OielCe1zX6A8drcMea_rplyloPHVN212TC2fbiDc_d0re58-r2Wu2WL68zZ4WWSVkOaQHFNPcliW4XFhRF5DX69xphXLtcn5KEVA5yWsmkZcFY0JJRMtcBaBrMSX34-6-D18HjIPpmlhh21qP4RAN6BxUqQuhE3r3B92FQ-_TdwYUCJGmdZkoGKmqDzH26My-bzrbHw0wczJrRrMmmTUnswZSh4-dmFi_wf7X8r-lb452eTs</recordid><startdate>20140501</startdate><enddate>20140501</enddate><creator>Lin, Tien-Chai</creator><creator>Huang, Wen-Feng</creator><creator>Huang, Wen-Chang</creator><general>Springer US</general><general>Springer Nature B.V</general><scope>AAYXX</scope><scope>CITATION</scope><scope>7SP</scope><scope>7SR</scope><scope>8BQ</scope><scope>8FD</scope><scope>8FE</scope><scope>8FG</scope><scope>ABJCF</scope><scope>AFKRA</scope><scope>ARAPS</scope><scope>BENPR</scope><scope>BGLVJ</scope><scope>CCPQU</scope><scope>D1I</scope><scope>DWQXO</scope><scope>F28</scope><scope>FR3</scope><scope>HCIFZ</scope><scope>JG9</scope><scope>KB.</scope><scope>L7M</scope><scope>P5Z</scope><scope>P62</scope><scope>PDBOC</scope><scope>PQEST</scope><scope>PQQKQ</scope><scope>PQUKI</scope><scope>S0W</scope><scope>7U5</scope></search><sort><creationdate>20140501</creationdate><title>The effect of hydrogen annealing on the molybdenum doped ZnO thin film</title><author>Lin, Tien-Chai ; Huang, Wen-Feng ; Huang, Wen-Chang</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-c349t-455062a991f73a3d817db7f65e4bf725506e1e5f42d04e29800354eea0fc116d3</frbrgroupid><rsrctype>articles</rsrctype><prefilter>articles</prefilter><language>eng</language><creationdate>2014</creationdate><topic>Annealing</topic><topic>Characterization and Evaluation of Materials</topic><topic>Chemistry and Materials Science</topic><topic>Deposition</topic><topic>Electrical resistivity</topic><topic>Materials Science</topic><topic>Molybdenum</topic><topic>Optical and Electronic Materials</topic><topic>Repairing</topic><topic>Thin films</topic><topic>Transmittance</topic><topic>Zinc oxide</topic><toplevel>peer_reviewed</toplevel><toplevel>online_resources</toplevel><creatorcontrib>Lin, Tien-Chai</creatorcontrib><creatorcontrib>Huang, Wen-Feng</creatorcontrib><creatorcontrib>Huang, Wen-Chang</creatorcontrib><collection>CrossRef</collection><collection>Electronics & Communications Abstracts</collection><collection>Engineered Materials Abstracts</collection><collection>METADEX</collection><collection>Technology Research Database</collection><collection>ProQuest SciTech Collection</collection><collection>ProQuest Technology Collection</collection><collection>Materials Science & Engineering Collection</collection><collection>ProQuest Central</collection><collection>Advanced Technologies & Aerospace Collection</collection><collection>ProQuest Central</collection><collection>Technology Collection</collection><collection>ProQuest One Community College</collection><collection>ProQuest Materials Science Collection</collection><collection>ProQuest Central Korea</collection><collection>ANTE: Abstracts in New Technology & Engineering</collection><collection>Engineering Research Database</collection><collection>SciTech Premium Collection</collection><collection>Materials Research Database</collection><collection>Materials Science Database</collection><collection>Advanced Technologies Database with Aerospace</collection><collection>ProQuest advanced technologies & aerospace journals</collection><collection>ProQuest Advanced Technologies & Aerospace Collection</collection><collection>Materials science collection</collection><collection>ProQuest One Academic Eastern Edition (DO NOT USE)</collection><collection>ProQuest One Academic</collection><collection>ProQuest One Academic UKI Edition</collection><collection>DELNET Engineering & Technology Collection</collection><collection>Solid State and Superconductivity Abstracts</collection><jtitle>Journal of materials science. Materials in electronics</jtitle></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext</fulltext></delivery><addata><au>Lin, Tien-Chai</au><au>Huang, Wen-Feng</au><au>Huang, Wen-Chang</au><format>journal</format><genre>article</genre><ristype>JOUR</ristype><atitle>The effect of hydrogen annealing on the molybdenum doped ZnO thin film</atitle><jtitle>Journal of materials science. Materials in electronics</jtitle><stitle>J Mater Sci: Mater Electron</stitle><date>2014-05-01</date><risdate>2014</risdate><volume>25</volume><issue>5</issue><spage>2138</spage><epage>2142</epage><pages>2138-2142</pages><issn>0957-4522</issn><eissn>1573-482X</eissn><abstract>The electrical characteristics of hydrogen annealing on the molybdenum doped ZnO (MZO) thin film were discussed in the paper. The MZO film was deposited by an radio frequency sputtering, then it was annealed in hydrogen with a microwave plasma chemical vapor deposition system. The resistivity of MZO was decreased from 1.1 × 10
−2
to 9.5 × 10
−3
Ω cm after the hydrogen annealing. Improvements of the electrical properties are both due to the defects repairing through annealing and hydrogen doping effects of the MZO thin film. The higher temperature annealed MZO film shows slightly lower transmittance which is due to the higher carrier concentration.</abstract><cop>Boston</cop><pub>Springer US</pub><doi>10.1007/s10854-014-1850-1</doi><tpages>5</tpages></addata></record> |
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subjects | Annealing Characterization and Evaluation of Materials Chemistry and Materials Science Deposition Electrical resistivity Materials Science Molybdenum Optical and Electronic Materials Repairing Thin films Transmittance Zinc oxide |
title | The effect of hydrogen annealing on the molybdenum doped ZnO thin film |
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