Electrospray droplet impact/secondary ion mass spectrometry (EDI/SIMS) for silver halides

Electrospray droplet imact/secondary ion mass spectrometry (EDI/SIMS) was applied to many materials such as synthetic polymers, metals, semiconductors, and biological tissues. Little surface modification was observed for these samples by in situ XPS analysis. In this work, silver halides AgX (X = F,...

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Bibliographic Details
Published in:Surface and interface analysis 2014-03, Vol.46 (3), p.134-138
Main Authors: Takaishi, Rio, Hiraoka, Kenzo
Format: Article
Language:English
Subjects:
cationization matrix
Droplets
EDI
electrospray droplet impact
Etching
Interface analysis
reactive etching
Secondary ion mass spectrometry
secondary ion mass specytrometry
Semiconductors
Silver halides
X-ray photoelectron spectroscopy
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Summary:Electrospray droplet imact/secondary ion mass spectrometry (EDI/SIMS) was applied to many materials such as synthetic polymers, metals, semiconductors, and biological tissues. Little surface modification was observed for these samples by in situ XPS analysis. In this work, silver halides AgX (X = F, Cl, Br, and I) were examined by EDI/SIMS. The preferential etching of F for AgF was observed for the first time. This is due to the highly reactive F atoms generated at the colliding interface that are quickly annihilated by the reaction with water molecules. The selective etching of fluorine results in the enrichment of silver on the sample surface leading to the abundant Ag+ ion formation. It was suggested that metal fluorides may be useful as the cationization matrices in EDI/SIMS. Copyright © 2014 John Wiley & Sons, Ltd.
ISSN:0142-2421
1096-9918
DOI:10.1002/sia.5360