Magnetic ordering in Cr-doped Bi sub(2)Se sub(3) thin films

We report the structural and magnetic study of Cr-doped Bi sub(2)Se sub(3) thin films using x-ray diffraction (XRD), magnetometry and polarized neutron reflectometry (PNR). Epitaxial layers were grown on c-plane sapphire by molecular beam epitaxy in a two-step process. High-resolution XRD shows the...

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Bibliographic Details
Published in:Europhysics letters 2014-09, Vol.107 (5), p.57009-p1-57009-p5
Main Authors: Collins-McIntyre, L J, Harrison, S E, Schonherr, P, Steinke, N-J, Kinane, C J, Charlton, T R, ALBA-VENEROA, D, PUSHP, A, Kellock, A J, Parkin, S S P, Harris, J S, Langridge, S, van der Laan, G, Hesjedal, T
Format: Article
Language:English
Subjects:
Chromium
Coercive force
Doped films
Epitaxial layers
Ferromagnetism
Order disorder
Thin films
X-ray diffraction
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Summary:We report the structural and magnetic study of Cr-doped Bi sub(2)Se sub(3) thin films using x-ray diffraction (XRD), magnetometry and polarized neutron reflectometry (PNR). Epitaxial layers were grown on c-plane sapphire by molecular beam epitaxy in a two-step process. High-resolution XRD shows the exceptionally high crystalline quality of the doped films with no parasitic phases up to a Cr concentration of 12% (in % of the Bi sites occupied by substitutional Cr). The magnetic moment, measured by SQUID magnetometry, was found to be ~2.1 mu sub(B) per Cr ion. The magnetic hysteresis curve shows an open loop with a coercive field of ~10mT. The ferromagnetic transition temperature was determined to be 8.5K analyzing the magnetization-temperature gradient. PNR shows the film to be homogeneously ferromagnetic with no enhanced magnetism near the surface or interface.
ISSN:0295-5075
1286-4854
DOI:10.1209/0295-5075/107/57009