Scattering of electromagnetic waves from planar chiral structures

A rigorous solution is found for the problem of reflection of E- and H-polarized plane electromagnetic waves from a metal plane covered by a chiral layer of arbitrary thickness. The dependence of the electromagnetic wave reflection on the chirality parameter and the layer thickness is studied. The r...

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Bibliographic Details
Published in:Radiophysics and quantum electronics 1999-09, Vol.42 (9), p.764-772
Main Authors: Neganov, V A, Osipov, O V
Format: Article
Language:English
Subjects:
Chirality
Constitutive relationships
Covering
Depolarization
Electromagnetic waves
Planes
Quantum electronics
Reflection
Scattering
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Summary:A rigorous solution is found for the problem of reflection of E- and H-polarized plane electromagnetic waves from a metal plane covered by a chiral layer of arbitrary thickness. The dependence of the electromagnetic wave reflection on the chirality parameter and the layer thickness is studied. The reflection of the depolarized component is examined. The results, obtained using two different forms of the constitutive relations for a chiral medium, are compared.[PUBLICATION ABSTRACT]
ISSN:0033-8443
1573-9120
DOI:10.1007/BF02676862