Effects of CuO Addition on the Microstructure and Microwave Dielectric Properties of MgTa sub(2)O sub(6) Ceramics

MgTa sub(2)O sub(6) powders with the tetragonal phase have been synthesized by mixed oxide method at 1100 [degrees]C when the molar ratios of MgO and Ta sub(2)O sub(5) increase from 1:1 to 1.2:1. The microwave dielectric properties of sintered MgTa sub(2)O sub(6) ceramics without additives at 1400[d...

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Bibliographic Details
Published in:Key engineering materials 2012-06, Vol.512-515, p.1222-1225
Main Authors: Fu, Bao Jian, Zhang, Ying Chun, Su, Xiao Li, Liu, Yan Hong, Hong, Ming
Format: Article
Language:English
Subjects:
Additives
CERAMICS
COPPER OXIDE
DIELECTRIC CONSTANT
Dielectric properties
ELECTRICAL PROPERTIES
INSULATION (ELECTRICAL)
Microstructure
MICROSTRUCTURES
MICROWAVES
OXIDES
PROPERTIES
Scanning electron microscopy
Sintering (powder metallurgy)
Tantalum oxides
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Summary:MgTa sub(2)O sub(6) powders with the tetragonal phase have been synthesized by mixed oxide method at 1100 [degrees]C when the molar ratios of MgO and Ta sub(2)O sub(5) increase from 1:1 to 1.2:1. The microwave dielectric properties of sintered MgTa sub(2)O sub(6) ceramics without additives at 1400[degrees]C for 6h, which consists of tetragonal and orthorhombic phases have been investigated. The results show that the ceramic possesses a dielectric constant of 27.5, a high Qxf value of 156000 GHz and a temperature coefficient of resonant frequency of 21.6 ppm/[degrees]C at 6-10 GHz. Different amounts of CuO has been used as sintering additives to lower the sintering temperature of MgTa sub(2)O sub(6) ceramics. The effect of the CuO doping agent on the microstructure, densification and the microwave dielectric properties of MgTa sub(2)O sub(6) ceramics has been studied using X-ray diffraction, scanning electron microscope and HP8720ES network analyzer. The results indicate that the 1-5 wt. % CuO dopant can lower the sintering temperatures of this materials dramatically. The second phase of CuTa sub(2)O sub(6) was found in MgTa sub(2)O sub(6) ceramics, which caused the deterioration of Qxf value of the ceramics.
ISSN:1013-9826
DOI:10.4028/www.scientific.net/KEM.512-515.1222