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Study of Metals by Femtosecond Laser Processing for Electro-Optics Applications

Femtosecond laser (FS-laser) microstructuring of metals has become a promising tool because of its non-contact nature, which allows the micromachining and direct processing of materials with a minimized volume of heat-affected zone for electro-optics applications such as light emitting diodes (LED)...

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Bibliographic Details
Published in:Key engineering materials 2012-06, Vol.516, p.263-268
Main Authors: Chang, Cho Wei, Ting, Chia Jen, Chang, Tien Li, Tsai, Ting Kai, Wang, Chien Ping, Chou, Chang Pin
Format: Article
Language:English
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Summary:Femtosecond laser (FS-laser) microstructuring of metals has become a promising tool because of its non-contact nature, which allows the micromachining and direct processing of materials with a minimized volume of heat-affected zone for electro-optics applications such as light emitting diodes (LED) and solar photovoltaic (PV) lighting. This study presents ultra-short pulse (10-15 sec) FS-laser processing. Through integrating the laser source, optical system and dynamic control modules, the materials of metals with micro-scale or nanoscale structures can be fabricated. In traditional processing such as semiconductor processing, development, exposure and etching necessitate expensive equipment and time-consuming tasks. With FS-laser processing, high-precision patterns are obtained, which will be a great benefit to keeping costs down. In this study, the wavelengths of FS-laser ablation are employed using visible and infrared light. To make a breakthrough in electro-optics processes, the CIGS thin-film of solar cells in metal process can be easily produced by the FS-laser. The ablation speed of the FS-laser for thin film layer CIGS solar cells can reach 2000 mm/s which is faster than the current Nd:YAG laser machine (~1000 mm/s). On the other hand, the minimum size of metal lines can be controlled to a value that is lower than 40 µm. Furthermore, green energy can be effectively developed for the future.
ISSN:1013-9826
1662-9795
1662-9795
DOI:10.4028/www.scientific.net/KEM.516.263