Oxygen vacancy redistribution in PbZr sub(x)Ti sub(1-x)O sub(3) (PZT) under the influence of an electric field

Oxygen isotope exchange experiments are performed in donor doped PbZr sub(x)Ti sub(1-x)O sub(3) (PZT) under field load. A detailed mapping of the oxygen tracer ions and thus indirectly of the oxygen vacancy distribution is enabled by spatially resolved time-of-flight secondary ion mass spectrometry...

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Bibliographic Details
Published in:Solid state ionics 2014-09, Vol.262, p.625-629
Main Authors: Holzlechner, G, Kastner, D, Slouka, C, Hutter, H, Fleig, J
Format: Article
Language:English
Subjects:
Cathodes
Copper
Electric fields
Electrodes
Lead zirconate titanates
Secondary ion mass spectrometry
Tracers
Vacancies
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Summary:Oxygen isotope exchange experiments are performed in donor doped PbZr sub(x)Ti sub(1-x)O sub(3) (PZT) under field load. A detailed mapping of the oxygen tracer ions and thus indirectly of the oxygen vacancy distribution is enabled by spatially resolved time-of-flight secondary ion mass spectrometry (ToF-SIMS). Hence, knowledge can be gained on the oxygen vacancy redistribution under the influence of high electric fields applied to Cu inner electrodes of a PZT multilayer stack Upon field load an enhanced oxygen tracer concentration is measured near to the cathode and interpreted in terms of a field-driven oxygen vacancy accumulation at an oxide ion blocking Cu cathode. Oxygen tracer depth profiles in near-anode and near-cathode diffusion zones give quantitative information on local grain and grain boundary diffusion coefficients and their dependence on applied voltages.
ISSN:0167-2738
DOI:10.1016/j.ssi.2013.08.027