Interlayer exchange coupling of antiferromagnetic NiO layers through Cu spacer

The interlayer exchange coupling (IEC) of two antiferromagnetic (AF) NiO layers separated by the nonmagnetic (NM) spacer layer is observed by investigating exchange bias effect in the structure of ferromagnetic (FM)/AF/NM/AF. The IEC shows an oscillatory behavior with a period of about 1.1nm as the...

Full description

Saved in:
Bibliographic Details
Published in:Journal of magnetism and magnetic materials 2014, Vol.350, p.35-38
Main Authors: Li, B., Liu, W., Zhao, X.G., Gong, W.J., Feng, J.N., Zhang, Z.D.
Format: Article
Language:English
Subjects:
Amplitudes
Antiferromagnetism
Condensed matter: electronic structure, electrical, magnetic, and optical properties
Exact sciences and technology
Exchange bias
Ferromagnetism
Interfacial magnetic properties (multilayers, magnetic quantum wells, superlattices, magnetic heterostructures)
Interlayer exchange coupling
Interlayers
Joining
Magnetic properties and materials
Magnetic properties of surface, thin films and multilayers
Magnetism
Oscillations
Oscillatory
Physics
Spacers
Uncompensated spin
Citations: Items that this one cites
Items that cite this one
Online Access:Get full text
Tags: Add Tag
No Tags, Be the first to tag this record!
Description
Summary:The interlayer exchange coupling (IEC) of two antiferromagnetic (AF) NiO layers separated by the nonmagnetic (NM) spacer layer is observed by investigating exchange bias effect in the structure of ferromagnetic (FM)/AF/NM/AF. The IEC shows an oscillatory behavior with a period of about 1.1nm as the spacer layer thickness increases. The oscillation amplitude and phase also depend on the NiO layer thickness. A qualitative explanation of the experimental results is provided by the RKKY-like IEC between the AF uncompensated spins at the AF/NM interfaces rather than AF itself. •Interlayer exchange coupling (IEC) of two NiO layers separated is observed.•The IEC shows an oscillatory behavior with a period of about 1.1nm.•The oscillation amplitude and phase depend on the NiO layer thickness.•A qualitative explanation is provided by the RKKY-like IEC.
ISSN:0304-8853
DOI:10.1016/j.jmmm.2013.09.035