Surface investigations of ZnBeMnSe mixed crystals by means of the piezoelectric spectroscopy and the AFM technique

Piezoelectric photoacoustic spectroscopy with a piezoelectric detection has been used for measurements of the amplitude and phase spectra of Zn1-x-y Be x Mn y Se mixed semiconductors. The investigated crystals were grown from the melt by the modified high pressure Bridgman method under the argon ove...

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Bibliographic Details
Published in:Applied surface science 2014-01, Vol.290, p.27-34
Main Authors: STRZALKOWSKI, K, KULESZA, S, ZAKRZEWSKI, J, MALINSKI, M
Format: Article
Language:English
Subjects:
Amplitudes
Atomic force microscopy
Condensed matter: electronic structure, electrical, magnetic, and optical properties
Condensed matter: structure, mechanical and thermal properties
Correlation
Cross-disciplinary physics: materials science
rheology
Crystals
Exact sciences and technology
Mixed crystals
Physics
Piezoelectricity
Semiconductors
Spectra
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Summary:Piezoelectric photoacoustic spectroscopy with a piezoelectric detection has been used for measurements of the amplitude and phase spectra of Zn1-x-y Be x Mn y Se mixed semiconductors. The investigated crystals were grown from the melt by the modified high pressure Bridgman method under the argon overpressure. The preliminary study of the sample's surface of the investigated crystals was carried out using the AFM technique. The influence of a different surface treatment on the amplitude and phase piezoelectric spectra as well as on AFM images is presented and analyzed. The correlations between these two techniques have been found and are discussed. Piezoelectric (PZE) spectra were analyzed using an extended and modified Jackson-Amer theory.
ISSN:0169-4332
1873-5584
DOI:10.1016/j.apsusc.2013.10.180