A compound control chart for monitoring and controlling high quality processes

•A control chart (CC) for monitoring high quality processes is proposed.•The Run Length distribution of this CC is studied using an appropriate Markov Chain.•Numerical calculations are carried out to investigate the performance of the new CC.•The performance of the new CC is compared to alternative...

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Bibliographic Details
Published in:European journal of operational research 2014-03, Vol.233 (3), p.595-603
Main Authors: Bersimis, Sotiris, Koutras, Markos V., Maravelakis, Petros E.
Format: Article
Language:English
Subjects:
Applied probability
Conforming run length
Control charts
Equivalence
Experimentation
High quality processes
Markov chain impedance
Monitoring
Numerical analysis
Operational research
Operations research
Quality control
Run length distribution
Studies
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Summary:•A control chart (CC) for monitoring high quality processes is proposed.•The Run Length distribution of this CC is studied using an appropriate Markov Chain.•Numerical calculations are carried out to investigate the performance of the new CC.•The performance of the new CC is compared to alternative CCs. In the present article, we propose a new control chart for monitoring high quality processes. More specifically, we suggest declaring the monitored process out of control, by exploiting a compound rule couching on the number of conforming units observed between the (i−1)th and the ith nonconforming item and the number of conforming items observed between the (i−2)th and the ith nonconforming item. Our numerical experimentation demonstrates that the proposed control chart, in most of the cases, exhibits a better (or at least equivalent) performance than its competitors.
ISSN:0377-2217
1872-6860
DOI:10.1016/j.ejor.2013.08.017