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Investigation of structural, electrical and multiferroic properties of Co-doped Aurivillius Bi6Fe2Ti3O18 thin films
In this study, the structural, electrical and multiferroic properties of Bi6Fe2Ti3O18 and Bi6Fe1.5Co0.5Ti3O18−δ thin films were investigated. A chemical solution deposition method was used to prepare the thin films on Pt(111)/Ti/SiO2/Si(100) substrates. Both of the thin films crystallized with singl...
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Published in: | Ceramics international 2015-03, Vol.41 (2), p.3277-3282 |
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Main Authors: | , , , , |
Format: | Article |
Language: | English |
Subjects: | |
Citations: | Items that this one cites Items that cite this one |
Online Access: | Get full text |
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Summary: | In this study, the structural, electrical and multiferroic properties of Bi6Fe2Ti3O18 and Bi6Fe1.5Co0.5Ti3O18−δ thin films were investigated. A chemical solution deposition method was used to prepare the thin films on Pt(111)/Ti/SiO2/Si(100) substrates. Both of the thin films crystallized with single phase Aurivillius orthorhombic structures were confirmed by means of X-ray diffraction and Raman spectroscopy studies. X-ray diffraction study further revealed Co2+-ion doping to have a significant influence on the orientation of the Bi6Fe2Ti3O18 thin film. Electrical studies revealed that the leakage current density of the Bi6Fe1.5Co0.5Ti3O18−δ thin film was about two orders of magnitude lower than that of the Bi6Fe2Ti3O18 thin film. An enhanced remnant polarization (2Pr) of 7.4μC/cm2 and a remnant magnetization (2Mr) of 0.97emu/cm3 was obtained for the Bi6Fe1.5Co0.5Ti3O18−δ thin film by measuring the ferroelectric and ferromagnetic hysteresis loops at room temperature. |
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ISSN: | 0272-8842 1873-3956 |
DOI: | 10.1016/j.ceramint.2014.11.026 |