Development of a synchrotron powder diffractometer with a one-dimensional X-ray detector for analysis of advanced materials

• Published in: Journal of the Ceramic Society of Japan 2013/03/01, Vol.121(1411), pp.287-290
• Main Authors: TANAKA, Masahiko, KATSUYA, Yoshio, MATSUSHITA, Yoshitaka, SAKATA, Osami
• Format: Article
• Language: English
• Subjects: Angular resolution; Ceramics; Crystal structure; Detectors; Diffraction; Diffractometers; Full-automatic measurement; One-dimensional X-ray detector; Powder diffraction; Rietveld method; Synchrotron radiation; Synchrotrons; X-rays
• ISSN: 1882-0743; 1348-6535
• DOI: 10.2109/jcersj2.121.287

A new synchrotron X-ray diffractometer with a one-dimensional X-ray detector has been successfully developed for the purpose of high angular resolution, high efficiency and full automatic powder X-ray diffraction experiments. Sample-to-detector distance is designed to be 955 mm. This long distance enables us to obtain high angular resolution powder diffraction data. The one-dimensional detector can observe 3.84 degrees in 2θ per one exposure, thus multiple exposures at every 2θ angle are required to collect a whole powder diffraction pattern. The minimum step size of 2θ is approximately 0.003 degrees. A full automatic data-collection system is achieved with a newly developed diffractometer control program that covers the whole system; a sample exchanger, a sample position adjustment, diffractometer axes and data collection. Diffraction peak profile and angular resolution are comparable to that of the imaging plate Debye–Scherrer camera with the same sample-to-detector distance. Diffraction data of a standard sample (NIST-CeO2) obtained by this system was analyzed properly using Rietveld method.