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Electrospray droplet impact/secondary ion mass spectrometry (EDI/SIMS) using mixed solvents of water/methanol and water/2-propanol as projectile droplets
The electrospray droplet impact/secondary ion mass spectrometry (EDI/SIMS) using charged electrospray water droplets realized the atomic and molecular level etching with leaving little damage on the surface. In this work, the binary mixtures of water and alcohols (methanol and 2‐propanol) were exami...
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Published in: | Surface and interface analysis 2014-06, Vol.46 (6), p.418-424 |
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Main Authors: | , |
Format: | Article |
Language: | English |
Subjects: | |
Citations: | Items that this one cites Items that cite this one |
Online Access: | Get full text |
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Summary: | The electrospray droplet impact/secondary ion mass spectrometry (EDI/SIMS) using charged electrospray water droplets realized the atomic and molecular level etching with leaving little damage on the surface. In this work, the binary mixtures of water and alcohols (methanol and 2‐propanol) were examined as the charged electrospray droplets. The increase of desorption efficiency and softer ionization are observed for rhodamine B and bradykinin with higher content of alcohols. The etching rates for SiO2 and polystyrene 35000 were found to be more or less the same for 100% H2O and H2O/MeOH projectiles. However, 60 vol.% 2‐propanol gave much lower etching rates than the water/methanol system for polystyrene 35000. This indicates that there is a marked difference in the energy dissipation processes between methanol and 2‐propanol projectiles for soft‐material target. Copyright © 2014 John Wiley & Sons, Ltd. |
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ISSN: | 0142-2421 1096-9918 |
DOI: | 10.1002/sia.5531 |