Thermal response of nanoscale cylindrical inclusions of amorphous silica embedded in α-quartz

The thermal response of nanoscale cylindrical inclusions of amorphous SiO sub(2) embedded in crystalline quartz (c - SiO sub(2)) is investigated by means of small-angle x-ray scattering. The inclusions are generated by swift heavy-ion irradiation that leads to the formation of amorphous ion tracks a...

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Bibliographic Details
Published in:Physical review. B, Condensed matter and materials physics Condensed matter and materials physics, 2014-12, Vol.90 (22), Article 224108
Main Authors: Afra, B., Nordlund, K., Rodriguez, M. D., Bierschenk, T., Trautmann, C., Mudie, S., Kluth, P.
Format: Article
Language:English
Subjects:
Annealing
Condensed matter
Crystal structure
Elastic constants
Inclusions
Ion trajectories
Nanostructure
Silicon dioxide
Thermal response
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Summary:The thermal response of nanoscale cylindrical inclusions of amorphous SiO sub(2) embedded in crystalline quartz (c - SiO sub(2)) is investigated by means of small-angle x-ray scattering. The inclusions are generated by swift heavy-ion irradiation that leads to the formation of amorphous ion tracks along the ion trajectories. During in situ annealing between room temperature and 620 [degrees]C, we observe an irreversible expansion of the track cylinders followed by a reversible contraction. The reversible "elastic" response of the tracks can be modeled using the temperature-dependent elastic properties of bulk amorphous and crystalline SiO sub(2) for the inclusions and the matrix, respectively. A high initial interface pressure of the nanocylinders is apparent from the calculations.
ISSN:1098-0121
1550-235X
DOI:10.1103/PhysRevB.90.224108