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Increased crystallinity of octadecylphosphonic acid Langmuir–Blodgett films with an increasing number of layers

We report that contact mode atomic force microscopy (AFM) imaging is useful in revealing crystallinity of octadecylphosphonic acid (OPA) Langmuir–Blodgett (LB) films. On a monolayer OPA LB film prepared on the native oxide of a Si wafer, no molecular-resolution could be obtained. However, molecular-...

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Bibliographic Details
Published in:Thin solid films 2013-06, Vol.537, p.242-246
Main Authors: Zhao, F.Z., Dey, R., Nie, H.-Y., Lau, W.M.
Format: Article
Language:English
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Summary:We report that contact mode atomic force microscopy (AFM) imaging is useful in revealing crystallinity of octadecylphosphonic acid (OPA) Langmuir–Blodgett (LB) films. On a monolayer OPA LB film prepared on the native oxide of a Si wafer, no molecular-resolution could be obtained. However, molecular-resolution images were obtained on a bilayer surface, a reflection that molecules in the top layer adjust their alkyl chains to accommodate those from below to form a closely packed, OPA headgroup-terminated surface. We demonstrate that with an increasing number of layers, the crystallinity of multilayer OPA LB films improves as molecular-resolution AFM images obtained on even-numbered multilayers reveal that the terminating OPA headgroups form a sheet of hexagonal array. •Langmuir–Blodgett (LB) films of octadecylphosphonic acid (OPA) on SiO2.•Atomic force microscopy (AFM) imaging of OPA LB films.•Molecular-resolution AFM images on even-numbered OPA multilayers.•OPA headgroups form a sheet-like crystalline structure.•OPA molecules in monolayer LB film are weakly bonded to substrate.
ISSN:0040-6090
1879-2731
DOI:10.1016/j.tsf.2013.04.117