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Two-step growth of metamorphic GaAs/AlGaAs mirror on an InP substrate by MOCVD
This paper describes a high-reflectivity metamorphic undoped GaAs/Al0.98Ga0.02As distributed Bragg reflector grown on an InP substrate by metalorganic chemical vapor deposition (MOCVD). Optimal two-step growth conditions at low and high growth temperatures can provide a smooth surface morphology, le...
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Published in: | Thin solid films 2013-09, Vol.542, p.317-326 |
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Main Authors: | , |
Format: | Article |
Language: | English |
Subjects: | |
Citations: | Items that this one cites Items that cite this one |
Online Access: | Get full text |
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Summary: | This paper describes a high-reflectivity metamorphic undoped GaAs/Al0.98Ga0.02As distributed Bragg reflector grown on an InP substrate by metalorganic chemical vapor deposition (MOCVD). Optimal two-step growth conditions at low and high growth temperatures can provide a smooth surface morphology, leading to a high reflectivity (>99.5%) with little optical scattering loss. We also show that a large mismatched interface does not create dislocations in the active layer at a slow cooling rate after the growth sequence. These results indicate that metamorphic GaAs/Al0.98Ga0.02As directly grown on an InP substrate by MOCVD is promising for application to InP-based vertical cavity surface-emitting laser structures.
•We report AlGaAs/GaAs metamorphic mirror by metal-organic chemical vapor deposition.•We explain that a high reflectivity is difficult to achieve at a constant temperature.•We show two-step growth can provide a high-reflectivity mirror. (>99.5%)•A large mismatched interface does not create dislocations at a slow cooling rate. |
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ISSN: | 0040-6090 1879-2731 |
DOI: | 10.1016/j.tsf.2013.07.006 |