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Two-step growth of metamorphic GaAs/AlGaAs mirror on an InP substrate by MOCVD

This paper describes a high-reflectivity metamorphic undoped GaAs/Al0.98Ga0.02As distributed Bragg reflector grown on an InP substrate by metalorganic chemical vapor deposition (MOCVD). Optimal two-step growth conditions at low and high growth temperatures can provide a smooth surface morphology, le...

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Bibliographic Details
Published in:Thin solid films 2013-09, Vol.542, p.317-326
Main Authors: Ohiso, Yoshitaka, Iga, Ryuzo
Format: Article
Language:English
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Summary:This paper describes a high-reflectivity metamorphic undoped GaAs/Al0.98Ga0.02As distributed Bragg reflector grown on an InP substrate by metalorganic chemical vapor deposition (MOCVD). Optimal two-step growth conditions at low and high growth temperatures can provide a smooth surface morphology, leading to a high reflectivity (>99.5%) with little optical scattering loss. We also show that a large mismatched interface does not create dislocations in the active layer at a slow cooling rate after the growth sequence. These results indicate that metamorphic GaAs/Al0.98Ga0.02As directly grown on an InP substrate by MOCVD is promising for application to InP-based vertical cavity surface-emitting laser structures. •We report AlGaAs/GaAs metamorphic mirror by metal-organic chemical vapor deposition.•We explain that a high reflectivity is difficult to achieve at a constant temperature.•We show two-step growth can provide a high-reflectivity mirror. (>99.5%)•A large mismatched interface does not create dislocations at a slow cooling rate.
ISSN:0040-6090
1879-2731
DOI:10.1016/j.tsf.2013.07.006