Fast optimization of a bimorph mirror using x-ray grating interferometry

An x-ray grating interferometer was employed for in situ optimization of an x-ray bimorph mirror. Unlike many other at-wavelength techniques, only a single interferogram image, captured out of the focal plane, is required, enabling the optical surface to be quickly optimized. Moiré fringe analysis w...

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Bibliographic Details
Published in:Optics letters 2014-04, Vol.39 (8), p.2518-2521
Main Authors: Wang, Hongchang, Sawhney, Kawal, Berujon, Sebastien, Sutter, John, Alcock, Simon G, Wagner, Ulrich, Rau, Christoph
Format: Article
Language:English
Subjects:
Bimorphs
Diffraction gratings
Error analysis
Focal plane
Gratings (spectra)
Interferometry
Optimization
Slopes
X-rays
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Summary:An x-ray grating interferometer was employed for in situ optimization of an x-ray bimorph mirror. Unlike many other at-wavelength techniques, only a single interferogram image, captured out of the focal plane, is required, enabling the optical surface to be quickly optimized. Moiré fringe analysis was used to calculate the wavefront slope error, which is proportional to the mirror's slope error. Using feedback from grating interferometry, the slope error of a bimorph mirror was reduced to
ISSN:0146-9592
1539-4794
DOI:10.1364/ol.39.002518