Characterization of Sulfur Bonding in CdS:O Buffer Layers for CdTe-based Thin-Film Solar Cells

On the basis of a combination of X-ray photoelectron spectroscopy and synchrotron-based X-ray emission spectroscopy, we present a detailed characterization of the chemical structure of CdS:O thin films that can be employed as a substitute for CdS layers in thin-film solar cells. It is possible to an...

Full description

Saved in:
Bibliographic Details
Published in:ACS applied materials & interfaces 2015-08, Vol.7 (30), p.16382-16386
Main Authors: Duncan, Douglas A, Kephart, Jason M, Horsley, Kimberly, Blum, Monika, Mezher, Michelle, Weinhardt, Lothar, Häming, Marc, Wilks, Regan G, Hofmann, Timo, Yang, Wanli, Bär, Marcus, Sampath, Walajabad S, Heske, Clemens
Format: Article
Language:English
Citations: Items that this one cites
Items that cite this one
Online Access:Get full text
Tags: Add Tag
No Tags, Be the first to tag this record!
Description
Summary:On the basis of a combination of X-ray photoelectron spectroscopy and synchrotron-based X-ray emission spectroscopy, we present a detailed characterization of the chemical structure of CdS:O thin films that can be employed as a substitute for CdS layers in thin-film solar cells. It is possible to analyze the local chemical environment of the probed elements, in particular sulfur, hence allowing insights into the species-specific composition of the films and their surfaces. A detailed quantification of the observed sulfur environments (i.e., sulfide, sulfate, and an intermediate oxide) as a function of oxygen content is presented, allowing a deliberate optimization of CdS:O thin films for their use as alternative buffer layers in thin-film photovoltaic devices.
ISSN:1944-8244
1944-8252
DOI:10.1021/acsami.5b03503