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Charge and Nuclear Dynamics Induced by Deep Inner-Shell Multiphoton Ionization of CH3I Molecules by Intense X‑ray Free-Electron Laser Pulses

In recent years, free-electron lasers operating in the true X-ray regime have opened up access to the femtosecond-scale dynamics induced by deep inner-shell ionization. We have investigated charge creation and transfer dynamics in the context of molecular Coulomb explosion of a single molecule, expo...

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Bibliographic Details
Published in:The journal of physical chemistry letters 2015-08, Vol.6 (15), p.2944-2949
Main Authors: Motomura, Koji, Kukk, Edwin, Fukuzawa, Hironobu, Wada, Shin-ichi, Nagaya, Kiyonobu, Ohmura, Satoshi, Mondal, Subhendu, Tachibana, Tetsuya, Ito, Yuta, Koga, Ryosuke, Sakai, Tsukasa, Matsunami, Kenji, Rudenko, Artem, Nicolas, Christophe, Liu, Xiao-Jing, Miron, Catalin, Zhang, Yizhu, Jiang, Yuhai, Chen, Jianhui, Anand, Mailam, Kim, Dong Eon, Tono, Kensuke, Yabashi, Makina, Yao, Makoto, Ueda, Kiyoshi
Format: Article
Language:English
Online Access:Get full text
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Summary:In recent years, free-electron lasers operating in the true X-ray regime have opened up access to the femtosecond-scale dynamics induced by deep inner-shell ionization. We have investigated charge creation and transfer dynamics in the context of molecular Coulomb explosion of a single molecule, exposed to sequential deep inner-shell ionization within an ultrashort (10 fs) X-ray pulse. The target molecule was CH3I, methane sensitized to X-rays by halogenization with a heavy element, iodine. Time-of-flight ion spectroscopy and coincident ion analysis was employed to investigate, via the properties of the atomic fragments, single-molecule charge states of up to +22. Experimental findings have been compared with a parametric model of simultaneous Coulomb explosion and charge transfer in the molecule. The study demonstrates that including realistic charge dynamics is imperative when molecular Coulomb explosion experiments using short-pulse facilities are performed.
ISSN:1948-7185
1948-7185
DOI:10.1021/acs.jpclett.5b01205