Procedure to count atoms with trustworthy single-atom sensitivity

We report a method to reliably count the number of atoms from high-angle annular dark field scanning transmission electron microscopy images. A model-based analysis of the experimental images is used to measure scattering cross sections at the atomic level. The high sensitivity of these measurements...

Full description

Saved in:
Bibliographic Details
Published in:Physical review. B, Condensed matter and materials physics Condensed matter and materials physics, 2013-02, Vol.87 (6), Article 064107
Main Authors: Van Aert, S., De Backer, A., Martinez, G. T., Goris, B., Bals, S., Van Tendeloo, G., Rosenauer, A.
Format: Article
Language:English
Subjects:
Atomic structure
Computer simulation
Condensed matter
Counting
Image transmission
Nanocrystals
Scattering cross sections
Citations: Items that this one cites
Items that cite this one
Online Access:Get full text
Tags: Add Tag
No Tags, Be the first to tag this record!
Description
Summary:We report a method to reliably count the number of atoms from high-angle annular dark field scanning transmission electron microscopy images. A model-based analysis of the experimental images is used to measure scattering cross sections at the atomic level. The high sensitivity of these measurements in combination with a thorough statistical analysis enables us to count atoms with single-atom sensitivity. The validity of the results is confirmed by means of detailed image simulations. We will show that the method can be applied to nanocrystals of arbitrary shape, size, and atom type without the need for a priori knowledge about the atomic structure.
ISSN:1098-0121
1550-235X
DOI:10.1103/PhysRevB.87.064107