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Height-Height Correlation Function to Determine Grain Size in Iron Phthalocyanine Thin Films
Quasi one-dimensional iron chains are formed in thermally evaporated iron phthalocyanine (FeC32N8H16) thin films on silicon substrates. The chain length is modified by the deposition temperature during growth. Atomic force microscopy images show spherical grains at low deposition temperatures that b...
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Published in: | Journal of physics. Conference series 2013-01, Vol.417 (1), p.12069-5 |
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description | Quasi one-dimensional iron chains are formed in thermally evaporated iron phthalocyanine (FeC32N8H16) thin films on silicon substrates. The chain length is modified by the deposition temperature during growth. Atomic force microscopy images show spherical grains at low deposition temperatures that become highly elongated at high deposition temperatures due to diffusion. The grain distributions are quantitatively characterized with a watershed-based segmentation algorithm and a height-height correlation function. The grain size distributions are found to be characteristically distinct for the α-phase and β-phase samples. The average effective grain size from the distribution is proportional to the correlation length found from the height-height correlation function and grows exponentially with deposition temperature. The long-range roughness and Hurst parameter increase only slightly with the deposition temperature. |
doi_str_mv | 10.1088/1742-6596/417/1/012069 |
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The chain length is modified by the deposition temperature during growth. Atomic force microscopy images show spherical grains at low deposition temperatures that become highly elongated at high deposition temperatures due to diffusion. The grain distributions are quantitatively characterized with a watershed-based segmentation algorithm and a height-height correlation function. The grain size distributions are found to be characteristically distinct for the α-phase and β-phase samples. The average effective grain size from the distribution is proportional to the correlation length found from the height-height correlation function and grows exponentially with deposition temperature. 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The long-range roughness and Hurst parameter increase only slightly with the deposition temperature.</description><subject>Algorithms</subject><subject>Atomic force microscopy</subject><subject>Beta phase</subject><subject>Chains</subject><subject>Correlation</subject><subject>Deposition</subject><subject>Elongation</subject><subject>Grain size</subject><subject>Grain size distribution</subject><subject>Grains</subject><subject>Image segmentation</subject><subject>Iron</subject><subject>Metal phthalocyanines</subject><subject>Physics</subject><subject>Silicon substrates</subject><subject>Temperature</subject><subject>Thin films</subject><issn>1742-6596</issn><issn>1742-6588</issn><issn>1742-6596</issn><fulltext>true</fulltext><rsrctype>article</rsrctype><creationdate>2013</creationdate><recordtype>article</recordtype><sourceid>PIMPY</sourceid><recordid>eNpdkMtKxDAUhosoOI6-ghTcuKnNpc1lKaNzgQEFx50Q0jS1GdpmTNrF-PSmVkQ8m__A_3E4fFF0DcEdBIylkGYoITknaQZpClMAESD8JJr9Fqd_9vPowvs9ADgMnUVva23e6z6ZIl5Y53Qje2O7eDl06nvpbfyge-1a0-l45aTp4hfzqeOQGxf657qvZWPVUXYjsatDsTRN6y-js0o2Xl_95Dx6XT7uFutk-7TaLO63icIk68NbUCPKsxxDWnCGSsVoQbmSqkJliXPFAGW8zKqshEVVEJpXrNA5qjAuKNUSz6Pb6e7B2Y9B-160xivdNLLTdvACUsg4ZASQgN78Q_d2cF34TqCcUsQxhTxQZKKUs947XYmDM610RwGBGKWL0acYfYogXUAxScdfQRR0iA</recordid><startdate>20130101</startdate><enddate>20130101</enddate><creator>Gredig, Thomas</creator><creator>Silverstein, Evan A</creator><creator>Byrne, Matthew P</creator><general>IOP Publishing</general><scope>AAYXX</scope><scope>CITATION</scope><scope>8FD</scope><scope>8FE</scope><scope>8FG</scope><scope>ABUWG</scope><scope>AFKRA</scope><scope>ARAPS</scope><scope>AZQEC</scope><scope>BENPR</scope><scope>BGLVJ</scope><scope>CCPQU</scope><scope>DWQXO</scope><scope>H8D</scope><scope>HCIFZ</scope><scope>L7M</scope><scope>P5Z</scope><scope>P62</scope><scope>PIMPY</scope><scope>PQEST</scope><scope>PQQKQ</scope><scope>PQUKI</scope><scope>PRINS</scope><scope>7U5</scope><scope>8BQ</scope><scope>JG9</scope></search><sort><creationdate>20130101</creationdate><title>Height-Height Correlation Function to Determine Grain Size in Iron Phthalocyanine Thin Films</title><author>Gredig, Thomas ; Silverstein, Evan A ; Byrne, Matthew P</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-c364t-651e27945317b982dc87b79cacf2dd35c80789d4f4d1bfb675f8be52f33b77ea3</frbrgroupid><rsrctype>articles</rsrctype><prefilter>articles</prefilter><language>eng</language><creationdate>2013</creationdate><topic>Algorithms</topic><topic>Atomic force microscopy</topic><topic>Beta phase</topic><topic>Chains</topic><topic>Correlation</topic><topic>Deposition</topic><topic>Elongation</topic><topic>Grain size</topic><topic>Grain size distribution</topic><topic>Grains</topic><topic>Image segmentation</topic><topic>Iron</topic><topic>Metal phthalocyanines</topic><topic>Physics</topic><topic>Silicon substrates</topic><topic>Temperature</topic><topic>Thin films</topic><toplevel>peer_reviewed</toplevel><toplevel>online_resources</toplevel><creatorcontrib>Gredig, Thomas</creatorcontrib><creatorcontrib>Silverstein, Evan A</creatorcontrib><creatorcontrib>Byrne, Matthew P</creatorcontrib><collection>CrossRef</collection><collection>Technology Research Database</collection><collection>ProQuest SciTech Collection</collection><collection>ProQuest Technology Collection</collection><collection>ProQuest Central (Alumni)</collection><collection>ProQuest Central</collection><collection>Advanced Technologies & Aerospace Collection</collection><collection>ProQuest Central Essentials</collection><collection>ProQuest Central</collection><collection>Technology Collection</collection><collection>ProQuest One Community College</collection><collection>ProQuest Central</collection><collection>Aerospace Database</collection><collection>SciTech Premium Collection</collection><collection>Advanced Technologies Database with Aerospace</collection><collection>Advanced Technologies & Aerospace Database</collection><collection>ProQuest Advanced Technologies & Aerospace Collection</collection><collection>Publicly Available Content Database</collection><collection>ProQuest One Academic Eastern Edition (DO NOT USE)</collection><collection>ProQuest One Academic</collection><collection>ProQuest One Academic UKI Edition</collection><collection>ProQuest Central China</collection><collection>Solid State and Superconductivity Abstracts</collection><collection>METADEX</collection><collection>Materials Research Database</collection><jtitle>Journal of physics. 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Atomic force microscopy images show spherical grains at low deposition temperatures that become highly elongated at high deposition temperatures due to diffusion. The grain distributions are quantitatively characterized with a watershed-based segmentation algorithm and a height-height correlation function. The grain size distributions are found to be characteristically distinct for the α-phase and β-phase samples. The average effective grain size from the distribution is proportional to the correlation length found from the height-height correlation function and grows exponentially with deposition temperature. The long-range roughness and Hurst parameter increase only slightly with the deposition temperature.</abstract><cop>Bristol</cop><pub>IOP Publishing</pub><doi>10.1088/1742-6596/417/1/012069</doi><tpages>5</tpages><oa>free_for_read</oa></addata></record> |
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subjects | Algorithms Atomic force microscopy Beta phase Chains Correlation Deposition Elongation Grain size Grain size distribution Grains Image segmentation Iron Metal phthalocyanines Physics Silicon substrates Temperature Thin films |
title | Height-Height Correlation Function to Determine Grain Size in Iron Phthalocyanine Thin Films |
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