A Sagittally Bent Crystal for the Short Pulse X-ray Beamline at the Advanced Photon Source

The Short Pulse X-ray Imaging and Microscopy (SPXIM) Beamline at the Advanced Photon Source (APS) is being designed to provide a short-pulse focused beam at the sample some 60 m from the source. The second crystal in the horizontally diffracting double-crystal monochromator system is sagittally bent...

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Bibliographic Details
Published in:Journal of physics. Conference series 2014-03, Vol.493 (1), p.12023-4
Main Authors: Strons, Philip, Khounsary, Ali, Antimonov, Mikhail, Dufresne, Eric M, Reininger, Ruben
Format: Article
Language:English
Subjects:
Beams (radiation)
Crystals
Deformation
Finite element method
Ion beams
Monochromators
Particle beams
Particle physics
Photons
Physics
Pulse duration
Short pulses
X ray imagery
X-rays
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Summary:The Short Pulse X-ray Imaging and Microscopy (SPXIM) Beamline at the Advanced Photon Source (APS) is being designed to provide a short-pulse focused beam at the sample some 60 m from the source. The second crystal in the horizontally diffracting double-crystal monochromator system is sagittally bent to focus the full vertical fan of the beam, preserving the flux of a typical undulator beamline at the APS, while providing a time-angle correlated beam on the sample with a few-picosecond pulse duration. An energy scan using this system requires changing the bent radius of the second crystal. Undesirable distortions in the sagittally bent second crystal are due to anticlastic deformations. In this paper, the analysis and design of the bent crystal is presented including an examination of the mechanical interaction between the crystal and the two pairs of rollers used to bend it. Ray tracings including the anticlastic deformations obtained from an optimized finite element model show a minimal effect on the spot size at the sample position.
ISSN:1742-6596
1742-6588
1742-6596
DOI:10.1088/1742-6596/493/1/012023