Monitoring antiferromagnetism via angle-resolved Auger photoelectron coincidence spectroscopy: The case of NiO/Ag(001)

Spin selectivity in angle-resolved Auger photoelectron coincidence spectroscopy (AR-APECS) is used to probe electronic structure in antiferromagnetic thin films. In particular, exploiting the AR-APECS capability to discriminate Auger electron emission events characterized by a different spin of the...

Full description

Saved in:
Bibliographic Details
Published in:Physical review. B, Condensed matter and materials physics Condensed matter and materials physics, 2013-09, Vol.88 (9), Article 094403
Main Authors: Gotter, R., Sbroscia, M., Caminale, M., Vaidya, S. R., Perfetto, E., Moroni, R., Bisio, F., Iacobucci, S., Di Filippo, G., Offi, F., Ruocco, A., Stefani, G., Mattera, L., Cini, M.
Format: Article
Language:English
Subjects:
Antiferromagnetism
Auger electron spectroscopy
Augers
Line shape
Mathematical models
Neel temperature
Photoelectrons
Spectroscopy
Citations: Items that this one cites
Items that cite this one
Online Access:Get full text
Tags: Add Tag
No Tags, Be the first to tag this record!
Description
Summary:Spin selectivity in angle-resolved Auger photoelectron coincidence spectroscopy (AR-APECS) is used to probe electronic structure in antiferromagnetic thin films. In particular, exploiting the AR-APECS capability to discriminate Auger electron emission events characterized by a different spin of the ion in its final state, a sharp multiplet structure in the Ni MVV Auger line shape of NiO/Ag(001) thin films is measured below the critical Neel temperature. The assignment of multiplet terms follows from a close comparison of the experimental AR-APECS line shapes with the predictions based on semiempirical calculations on a cluster model and an open-band extension of the Cini-Sawatzky approach. In analogy to CoO, also in NiO, above the Neel temperature a more featureless Auger spectrum appears and AR-APECS does not disentangle anymore high-spin and low-spin contributions to the total Auger intensity. Such a behavior, which seems to be a general result for metal oxide antiferromagnetic systems, is discussed.
ISSN:1098-0121
1550-235X
DOI:10.1103/PhysRevB.88.094403