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Magnetic and superconductivity studies on (In sub(1-x)Fe sub(x)) sub(2)O sub(3) thin films
Magnetic, magnetoresistivity and superconductivity studies were carried out on (In sub(1-)xFe sub(x)) sub(2)O sub(3) (x = 0.00, 0.03, 0.05 and 0.07) thin films (2D structures) grown on glass substrate by electron beam evaporation technique at 350 [degrees]C. The films have an average size of 120 nm...
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Published in: | Journal of alloys and compounds 2015-07, Vol.637, p.436-442 |
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Main Authors: | , , , , , , , |
Format: | Article |
Language: | English |
Subjects: | |
Online Access: | Get full text |
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Summary: | Magnetic, magnetoresistivity and superconductivity studies were carried out on (In sub(1-)xFe sub(x)) sub(2)O sub(3) (x = 0.00, 0.03, 0.05 and 0.07) thin films (2D structures) grown on glass substrate by electron beam evaporation technique at 350 [degrees]C. The films have an average size of 120 nm particles. All the samples shown soft ferromagnetic hysteresis loops at room temperature and saturation magnetization increased with iron dopant concentration. Observed magnetization could be best interpreted by F-center mediated magnetic exchange interaction in the samples. Temperature dependent resistivity of the sample (x = 0.00 and 0.07) showed metallic behavior down to very low temperatures and superconductivity at 2 K for undoped In sub(2)O sub(3) whereas the In sub(1.86)Fe sub(0.14)O sub(3) sample shows superconductivity below 2 K in the absence of magnetic fields. The reduction in transition temperature was attributed to increase electrical disorder with iron doping. Both samples showed positive magnetoresistivity (MR) in superconducting state due to increase of resistivity resulting from breaking of superconducting Cooper pairs upon application of magnetic field. In addition, both the samples show feeble negative MR in normal electrical state. The observed MR in normal state is not due to spin polarized tunneling instead it is due to suppression of scattering of charge carrier by single occupied localized states. |
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ISSN: | 0925-8388 |
DOI: | 10.1016/j.jallcom.2015.02.167 |